Course detail

Methods and Equipment for Technical Diagnostic

FSI-XTDAcad. year: 2020/2021

The course introduces students to the theory of advanced measurement techniques and measuring systems with nanometer resolution.

Learning outcomes of the course unit

Students will acquire skills and experience with respect to measurement methods, application of sensors, and configurations and functional descriptions of measuring instruments.


Successful completion of the course is conditional on the knowledge and skills acquired in the courses "Physics I", "Physics II", "Metrological Physics".


Not applicable.

Recommended optional programme components

Not applicable.

Recommended or required reading

DOEBELIN, O.D. Measurement Systems. Application and Design. 4. vydání. New York: McGraw-Hill, 1990. 960 s. ISMN 0-07-100697-4.
Halliday,D., Resnick,R., Walker,J.: Fyzika. VUTIUM, 2014.
ANTHONY, D.M. Engineering Metrology. New York: Pergamon Press, 1987.
DOEBELIN, O.D. Measurement Systems. Application and Design. 4. vydání. New York: McGraw-Hill, 1990. 960 s. ISMN 0-07-100697-4.
Električeskije izměrenija nelekričeskich veličin. P.V. Novickij, ed. Leningrad: Energie, 1075. 575 s.
SERWAY, R.A. and BEICHNER, R.J. Physics for Scientist and Engineers with Modern Physics. 5. vydání. Orlando: Saunders College Publisching, 2000. 1551 s.
JENČÍK, J., KUHN, L. a další. Technická měření ve strojírenství. Praha: SNTL, 1982. 580 s.
ORNATSKIJ, P.P. Teoretičeskije osnovy informacionno-izměritělnoj techniki. Kijev: Vyšča škola, 1976. 431 s.

Planned learning activities and teaching methods

The course is taught through lectures supported by several laboratory experiments.

Assesment methods and criteria linked to learning outcomes

An examination composed from oral and written part. Active participation at laboratory experiments and making valuable reports.

Language of instruction


Work placements

Not applicable.


The course focuses on the physical principles of the selected measurement systems.

Specification of controlled education, way of implementation and compensation for absences

Attendance at seminars in labs is required.

Classification of course in study plans

  • Programme M2I-P Master's

    branch M-KSB , 2. year of study, summer semester, 4 credits, compulsory

Type of course unit



13 hours, optionally

Teacher / Lecturer


General definitions and theory. Statistics and data processing: classification of random parameters (Gaussian and uniform distribution). Law of error propagation. Experimental data processing.

Sensors: general classification, capacity sensors, sensors based on induction.

Advanced methods of visualisation and diagnostics: Michalson interferometry, X-ray diffraction, scanning electron microscopy, atomic force microscopy, scanning tunnelling microscopy.

Laboratory exercise

26 hours, compulsory

Teacher / Lecturer


Laboratory works:
Wire optics
LCD display

Practical demonstrations:
CT - Computer tomography for industry
LIBS – ablation using pulsed LASER beams
SEM – Scanning Electron Microscopy
AFM - Atomic Force Microscopy
STM – Scanning Tunneling Microscopy