Course detail

Methods of Structure Analysis

FSI-WA1Acad. year: 2020/2021

The course covers the folowing topics (with various degree of detail):
light microscopy, image analysis, laser scanning confocal microscopy (CLSM), common elements and functional blocks of electron microscopes, electron-matter interaction, scanning electron microscopy (SEM), special techniques in SEM, overview of methods of local chemical composition analysis, energy-dispersive spectroscopy (EDS), wave-dispersive spectroscopy (WDS), X-ray fluoerescence (XRF) and micro-XRF, cathodoluminescence spectroscopy (CL), electron backscatter difraction (EBSD), focused ion beam microscopy (FIB), transmission electron microscopy and scanning transmission electron microscopy (TEM,STEM), sample preparation techniques for SEM and TEM, diffraction- and scattering-based techniques utilizing X-rays

Learning outcomes of the course unit

Students will learn the principles, application range and limitations of the basic methods for structural and phase analyses, including samples' extraction and preparation. Based on this knowledge, the student should be able to select appropriate analytical techniqe to solve practical problems in material engineering.

Prerequisites

Requirements on previous knowledge is: physics basics (mechanics, electricity, magnetism and quantum theory) and mathematics (differential, integral and matrix calculus, statistics) as provided during BSc studies. Further, the knowledge on solid matter physics and crytsallography is required (crystal systems/lattices, reciprocal space, kinematic and dynamic diffraction theory, pole figure, basic stereographic triangle).

Co-requisites

Not applicable.

Recommended optional programme components

Not applicable.

Recommended or required reading

GOLDSTEIN, I. Joseph. Scanning electron microscopy and X-ray microanalysis. 3rd ed. New York: Kluwer, 2003, xix, 689 s. : il. + 1 CD-ROM. ISBN 0-306-47292-9. (EN)
BRANDON, David a Wayne D KAPLAN. Microstructural characterization of materials. New York: John Wiley, 1999, 409 s. : il. ISBN 0-471-98501-5. (EN)
ECKERTOVÁ, Ludmila a Luděk FRANK. Metody analýzy povrchů: elektronová mikroskopie a difrakce. Praha: Academia, 1996, 379 s. ISBN 80-200-0329-0. (CS)
FLEWITT, P. E. J a Robert K WILD. Physical methods for materials characterisation. Bristol: Institute of Physics Publishing, 1994, xvi, 517 p. : il. ISBN 0-7503-0320-4. (EN)
WILLIAMS, David Bernard a C. Barry CARTER. Transmission electron microscopy: a textbook for materials science. Second edition. New York: Springer, 2009, lxii, 760, 15 stran : ilustrace (některé barevné) ; 28 cm. ISBN 978-0-387-76500-6. (EN)
KARLÍK, Miroslav. Úvod do transmisní elektronové mikroskopie. Praha: České vysoké učení technické v Praze, 2011, 321 s. : il. (některé barev.) ; 30 cm. ISBN 978-80-01-04729-3. (CS)
FRANK, Luděk a Jaroslav KRÁL. Metody analýzy povrchů: iontové, sondové a speciální metody. Praha: Academia, 2002, 489 s. ISBN 80-200-0594-3. (CS)

Planned learning activities and teaching methods

The course is taught through lectures explaining the basic principles and theory of the given technique. Teaching is suplemented by practical demonstrations.

Assesment methods and criteria linked to learning outcomes

Exam consists of written and oral part. The course-unit credit is granted under condition of elaboration of the assigned projects.

Language of instruction

Czech

Work placements

Not applicable.

Aims

The course objective is to offer the students an overview and also the theoretical knowledge on principles of all basic methods for structural and phase analyses (physical principles of methods, instrument parameters, application scope of the methods, etc.), including sample preparation techniques. Based on practical demonstrations, the students will gain basic overview of procedures and methods used to solve problems and analysing results.

Specification of controlled education, way of implementation and compensation for absences

Compulsory attendance at exercises. Absence from classes is dealt with individually, usually by make-up exercises.

Classification of course in study plans

  • Programme N-MTI-P Master's, 1. year of study, summer semester, 5 credits, compulsory
  • Programme N-FIN-P Master's, 1. year of study, summer semester, 5 credits, compulsory

Type of course unit

 

Lecture

39 hours, optionally

Teacher / Lecturer

Syllabus

The topics of the subject are going to be lectured in the following indicative order (actual order will be established according to organizational opportunities):
- light microscopy (repetition and broadening of knowledge gained in the subject Introduction to Material Science and Engineering - BUM)
- image analysis
- laser scanning confocal microscopy (CLSM)
- common elements and functional blocks of electron microscopes
- electron-matter interaction
- scanning electron microscopy (SEM)
- special techniques in SEM, high resolution SEM
- overview of methods of local chemical composition analysis
- energy-dispersive spectroscopy (EDS)
- wave-dispersive spectroscopy (WDS)
- algorithms of chemical composition quantitation based on EDS/WDS measurement
- X-ray fluoerescence (XRF) and micro-XRF
- cathodoluminescence spectroscopy (CL)
- electron backscatter difraction (EBSD)
- focused ion beam microscopy (FIB)
- transmission electron microscopy and scanning transmission electron microscopy (TEM,STEM)
- spectroscopy techniques in TEM, STEM
- sample preparation techniques for SEM and TEM
- diffraction- and scattering-based techniques utilizing X-rays

Laboratory exercise

26 hours, compulsory

Teacher / Lecturer

Syllabus

Topics of the subject will be tought in the following indicative order. Actual order, eventually also grouping of topics, is subject to opportunities in organizing the practical lessons:
- light microscopy and image analysis
- laser scanning confocal microscopy (CLSM)
- scanning electron microscopy (SEM)
- energy- and wave-dispersive spectroscopy (EDS, WDS)
- electron backscatter difraction (EBSD)
- focused ion beam microscopy (FIB)
- transmission electron microscopy and scanning transmission electron microscopy (TEM,STEM), electron energy loss spectroscopy (EELS) and EDS in TEM
- sample preparation techniques for SEM and TEM
- X-ray diffraction (XRD), phase composition assessment

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