Microscopy and Spectroscopy
FSI-TMKAcad. year: 2019/2020
Introduction to light microscopy (historical overview completed by substantial pieces of knowledge of geometric and wave optics, light-microscope optical setup, basic techniques of light microscopy and practical knowledge), theoretical description of image formation (wave theory of image formation based on the Abbe theory), confocal microscopy (principle, setup of the device, imaging properties), fluorescence microscopy (principle, setup of the device, imaging properties), interference and holographic microscopy (principle, setup of the device, imaging properties), spectroscopic methods, X-ray photoelectron spectroscopy (XPS, principle, setup of the device, parameters), secondary ion mass spectrometry (SIMS, principle, setup of the device, parameters), low-energy ion scattering spectroscopy (LEIS, principle, setup of the device, parameters).
Demonstrations and practical exercises on light microscopy and spectroscopy and on particle spectroscopy are carried out in laboratories.
Learning outcomes of the course unit
Students will learn about the history and modern techniques and approaches in the field of light microscopy and spectroscopies (light and particle) and fundamental practical experience with relevant devices. Among others, it help them to select their own topic (for diploma or doctoral thesis).
Elementary Physics, Quantum Physics, Solid State Physics, Surfaces and Thin Films, Geometrical and wave optics.
Recommended optional programme components
Recommended or required reading
D. B. Murphy: Fundamentals of light microscopy and electronic imaging. Wiley-Liss, Hoboken 2001.
A. R. Hibbs: Confocal Microscopy for Biologists. Springer, 2004.
H. Kuzmany: Solid-state spectroscopy. Springer, 2009. (EN)
H. Friedrich: Scattering Theory. Springer, Heidelberg, New York, Dordrecht, London 2013. (EN)
J. Čechal: Analýza povrchu a tenkých vrstev využitím fotoelektronové spektroskopie. Dizertační práce, VUT v Brně, 2006. (CS)
R. G. Wilson, F. A. Stevie, AND C. W. Magee: Secondary Ion Mass Spectrometry – a practical handbook for depth profiling and bulk analysis. John Wiley, 1989. (EN)
R. Chmelík: Materiály do praktika předmětu Mikroskopie a spektroskopie. Elektronický studijní text, Brno, 2014. (CS)
M. CH. Barschick, D. C. Duckworth, D. H. Smith: Inorganic mass spectrometry - fundamentals and applications. Marcel Dekker, NY, 2000. (EN)
A. Beninghoven: Secondary ion mass spectrometry - basics concepts, instrumental aspects, applications and trends. John Wiley, NY, volume 86, 1987. (EN)
D. Briggs, M. P. Seah (Eds.): Practical Surface Analysis, vol. 1: Auger and X-ray Photoelectron Spectroscopy, sec. ed., John Wiley, Chichester, UK, 1993. (EN)
D. Briggs, J. Grant (eds.): Surface analysis by Auger and X-ray photoelectron spectroscopy, IM Publications and Surface Spectra Ltd., Trowbridge 2003. (EN)
E. Keprt: Teorie optických přístrojů 2, Teorie a konstrukce mikroskopu, SPN, Praha 1966. (CS)
Internetové zdroje: http://micro.magnet.fsu.edu/primer http://microscopyu.com (EN)
Planned learning activities and teaching methods
The course is taught through lectures explaining the basic principles and theory of the discipline. Teaching is suplemented by practical laboratory work.
Assesment methods and criteria linked to learning outcomes
The assessment of a student is made upon his performance in written and oral part of the exam.
Language of instruction
The goal of the course is to provide students an overview of the principle and methods of light microscopy and spectroscopy, and of particle spectroscopy and give them practical experience with relevant devices.
Specification of controlled education, way of implementation and compensation for absences
The presence of students is monitored by the tutor. Maximum of tolerated absence is 25 %.
Type of course unit
26 hours, optionally
Teacher / Lecturer
Introduction to microscopy
Theory of imaging
Interference and holographic microscopy
X-ray photoelectron spectroscopy (XPS)
Secondary ion mass spectrometry (SIMS)
Low-energy ion scattering spectroscopy (LEIS)
13 hours, compulsory
Teacher / Lecturer
The calculations of supportive theoretical examples take place during the whole semester. Demonstrations and practical exercises in laboratory of optical microscopy, in laboratory of surfaces and thin films.