Ing. Michal Pavlík, Ph.D.

Department of Microelectronics (UMEL)

Student is skilled on the basic terminology used in the field of technical diagnostics after successful completion of the course . Student understands the difference between physical and functional diagnostic methods. He knows the possible causes of measurement errors of electrical circuits and knows how to prevent them. Understands the principle on which it is based JTAG test interface. Can name the principles of electronic systems for ease of diagnostc ability.

The subject knowledge on the secondary school level is required.

Not applicable.

Not applicable.

Loveday,G.C.: Electronic testing and fault diagnosis, Longman, 1995 (EN)
Lenk,J.D.: McGraw-Hill electronic troubleshooting handbook, McGraw-Hill, 1995 (EN)
Pain,R.: Practical electronic fault finding and troubleshooting, Newnes, 1995 (EN)
Bushnell M.L., Agrawal V. D.: Essentials of Electronic Testing, Kluwer Academic Publishers, Boston, 2000 (EN)
Hurst L.S.: VLSI testing, The Institution of EE, London, 1998 (EN)
Miczo A.: Digital Logic Testing and Simulation, Wiley-Interscience, Hoboken,N.J., 2003 (EN)
Mourad S.: Principles of Testing Electronic Systems, John Wiley & Sons Inc., New York, 2000 (EN)
Segura J., Hawkins Ch.F.: CMOS Electronics How It Works, How It Fails, IEEE Inc., 2004 (EN)
Burns M., Roberts G.W.: An Introduction to Mixed-Signal IC test and Measurement, Oxford University Press, 2001 (EN)
Kuo J.B., Lou J.: Low-Voltage CMOS VLSI Circuits, John Wiley & Sons, 1999 (EN)
Uyemura J.P.: Introduction to VLSI Circuits and Systems, John Wiley & Sons, 2002 (EN)
Kwok K.N.: Complete Guide To Semiconductor Devices, Mc Graw-Hill Inc., 1995 (EN)
MUSIL, V.,RECMAN, M., PROKOP, R. Diagnostika a testování elektronických systémů_S. ISBN MEL105. (skripta) (CS)
MUSIL, V., RECMAN, M., PROKOP, R. Diagnostika a testování elektronickýých systémů_P. ISBN MEL107. (skripta) (CS)
MUSIL, V., RECMAN, M., PROKOP, R. Diagnostika a testování elektronických systémů_L. ISBN MEL106. (skripta) (CS)

Teaching methods include lecture and laboratory excercises.

semestral project .................... 15 points
individual device analysis ....... 15 points
final test ............................... 70 points

Czech

Not applicable.

1. Introduction to technical diagnostics, basic terminology
2. Failure classification of electronic components, integrated circuits
3. Methods for electronic equipment evaluation
4. Measurement errors and their causes
5. Practical examples of electronic circuits evaluation
6. The feedback systems (sources, amplifiers), stability
7. Practical examples of diagnostic feedback circuit
8. Diagnosis and testing of digital circuits. Faults in logic circuits. Diagnosing faults in logic systems, modeling faults, testing of logic circuits, Boolean difference, creating tests for combinational circuits.
9. Built-in test systems (BIST) and Boundary Scan (JTAG)
10. Diagnosing analog signals
11. Proposal with regard to diagnostic ability, testing embedded systems - Development Models

To acquaint students with the basic concepts of technical diagnostics, to explain the differences between physical and functional approaches to diagnosis, clarify issues sources of errors that can occur during measurement and how to prevent them, get to know the basic methods of testing electrical blocks vestavětného familiar with the method of testing and JTAG interface contain, learn with the problems of circuit design for ease of diagnostic ability.

laboratory exercises

• Programme BPC-EKT Bachelor's, any year of study, summer semester, 6 credits, optional
  
• Programme BPC-MET Bachelor's, 2. year of study, summer semester, 6 credits, compulsory-optional
  

26 hours, optionally

Ing. Michal Pavlík, Ph.D.