Course detail

Diagnostics of Nanostructures

FSI-TDNAcad. year: 2018/2019

The subject is aimed at the explanation of physical principles of diagnostics of 1D and 2D nanostructures suitable for a study of morphological and structural parameters, as well as of their local properties. The individual methods, fundamentals of their selection and optimization with respect with their lateral resolution will be described. In addition to scanning probe microscopic metods (STM, AFM, EFM, MFM, SNOM, etc.) and electron and ion microscopy (TEM, SEM, etc.) also optical microscopic spectroscopic techniques (e.g. confocal scanning Raman spectroscopy and photoluminiscence) and their combination will be discussed (STL, cathodoluminiscence, TERS, etc.). These methods will be demonstrated and tested as well.

Learning outcomes of the course unit

Students will learn the current status of a new field called Diagnostics of Nanostructures which will also be of assistance to them for the selection of their diploma and doctoral theses.


Elementary Physics, Quantum Physics, Solid State Physics, Surfaces and Thin Films.


Not applicable.

Recommended optional programme components

Not applicable.

Recommended or required reading

Stroscio A., Keiser W. J.: Scanning Tunneling Microscopy, Academic Press, Inc., 1993.
Meyer E., Hug H. J.: Scanning Probe Microscopy, The Lab on a Tip, Springer , 2004.

Planned learning activities and teaching methods

The course is taught through lectures explaining the basic principles and theory of the discipline. Exercises are focused on practical topics presented in lectures. Teaching is suplemented by practical laboratory work.

Assesment methods and criteria linked to learning outcomes

The assessment of a student is made upon his performance in practice and quality of a discussion on topics selected at the colloquium (lecture notes allowed at preparation).

Language of instruction


Work placements

Not applicable.


The goal is to give an overview of the methods providing the diagnostics of 1D and 0D nanostructures concerning both their morphological and structural characteristics and their local electronic, optical, electrical and magnetic properties as well.

Specification of controlled education, way of implementation and compensation for absences

The presence of students at practice is obligatory and is monitored by the tutor. The way how to compensate missed practice lessons will be determined by the tutor depending on the extent and content of the missed lessons.

Classification of course in study plans

  • Programme M2A-P Master's

    branch M-FIN , 2. year of study, summer semester, 4 credits, compulsory-optional

Type of course unit



13 hours, optionally

Teacher / Lecturer


Introduction to Scanning Probe Microscopy (SPM); Scanning Tunneling Microscopy (STM) - principles of imaging by tunneling current and operation modes; scanning force microscopy (SFM) - relevant forces and operation modes; atomic force microscopy (AFM), magnetic force microscopy (MFM), electric force microscopy (EFM) and Kelvin force microscopy (KFM); scanning near field optical microscopy (SNOM); other types of SPM; principles of SPM design; electron and ion microscopy and spectroscopy (TEM/EELS, SEM/SAM,aj.); optical microscopy and spectroscopy (e.g. confocal scanning Raman spectroscopy and photoluminiscence); combined methods (STL, cathodoluminiscence, TERS, etc.).


14 hours, compulsory

Teacher / Lecturer


The calculation of supportive theoretical examples and practical demonstrations and testing take place during the whole semester.

Computer-assisted exercise

6 hours, compulsory

Teacher / Lecturer


See seminars.

labs and studios

6 hours, compulsory

Teacher / Lecturer


See seminars.