Publication detail

Ageing of Cadmium Telluride Radiation Detectors and its Diagnostics with Low Frequency Noise

ANDREEV, A. ŠIK, O. GRMELA, L. ŠIKULA, J.

Original Title

Ageing of Cadmium Telluride Radiation Detectors and its Diagnostics with Low Frequency Noise

Czech Title

Stárnutí Detektorů Ionizujícího Záření na Bázi CdTe a Jeho Diagnostika Pomocí Šumové Spektroskopie

English Title

Ageing of Cadmium Telluride Radiation Detectors and its Diagnostics with Low Frequency Noise

Type

journal article

Language

en

Original Abstract

Samples of CdTe single crystals which are used as radiation detectors were periodically measured during long time interval with different values of an applied voltage. The samples were also periodically exposed during long time periods to high temperatures of 390 K and to rapid changes of temperature from 300 K to 390 K. After 1.5 years of measurements we observed aging of the samples which resulted in deterioration of their transport characteristics. The resistance of the samples increased significantly and current-voltage characteristics were unstable in time. Noise spectroscopy showed that low frequency noise can be used for detection of CdTe samples ageing as its spectral density increases significantly comparing to the 1/f noise of a high quality sample.

Czech abstract

Samples of CdTe single crystals which are used as radiation detectors were periodically measured during long time interval with different values of an applied voltage. The samples were also periodically exposed during long time periods to high temperatures of 390 K and to rapid changes of temperature from 300 K to 390 K. After 1.5 years of measurements we observed aging of the samples which resulted in deterioration of their transport characteristics. The resistance of the samples increased significantly and current-voltage characteristics were unstable in time. Noise spectroscopy showed that low frequency noise can be used for detection of CdTe samples ageing as its spectral density increases significantly comparing to the 1/f noise of a high quality sample.

English abstract

Samples of CdTe single crystals which are used as radiation detectors were periodically measured during long time interval with different values of an applied voltage. The samples were also periodically exposed during long time periods to high temperatures of 390 K and to rapid changes of temperature from 300 K to 390 K. After 1.5 years of measurements we observed aging of the samples which resulted in deterioration of their transport characteristics. The resistance of the samples increased significantly and current-voltage characteristics were unstable in time. Noise spectroscopy showed that low frequency noise can be used for detection of CdTe samples ageing as its spectral density increases significantly comparing to the 1/f noise of a high quality sample.

Keywords

noise spectroscopy, CdTe radiation detectors, ageing process

RIV year

2013

Released

06.09.2013

Publisher

Versita

Location

Warszawa, Poland

Pages from

385

Pages to

394

Pages count

10

URL

BibTex


@article{BUT96607,
  author="Alexey {Andreev} and Ondřej {Šik} and Lubomír {Grmela} and Josef {Šikula}",
  title="Ageing of Cadmium Telluride Radiation Detectors and its Diagnostics with Low Frequency Noise",
  annote="Samples of CdTe single crystals which are used as radiation detectors were periodically measured during long time interval with different values of an applied voltage. The samples were also periodically exposed during long time periods to high temperatures of 390 K and to rapid changes of temperature from 300 K to 390 K. After 1.5 years of measurements we observed aging of the samples which resulted in deterioration of their transport characteristics. The resistance of the samples increased significantly and current-voltage characteristics were unstable in time. Noise spectroscopy showed that low frequency noise can be used for detection of CdTe samples ageing as its spectral density increases significantly comparing to the 1/f noise of a high quality sample.",
  address="Versita",
  chapter="96607",
  doi="10.2478/mms-2013-0033",
  institution="Versita",
  number="3",
  volume="2013",
  year="2013",
  month="september",
  pages="385--394",
  publisher="Versita",
  type="journal article"
}