Publication detail

IONS ELECTROMIGRATION IN TANTALUM CAPACITORS

SEDLÁKOVÁ, V. MAJZNER, J. ŠIKULA, J. TEVEROVSKY, D. ZEDNÍČEK, T.

Original Title

IONS ELECTROMIGRATION IN TANTALUM CAPACITORS

English Title

IONS ELECTROMIGRATION IN TANTALUM CAPACITORS

Type

conference paper

Language

en

Original Abstract

Electromigration of mobile ions in tantalum capacitors at various temperatures and biases was investigated. An analysis of the charge carrier transport was performed to describe the leakage current (DCL) kinetics at high temperature and high electric field for MnO2 and conducting polymer (CP) cathodes. I-V characteristics in normal and reverse mode in the temperature range from 27 to 140 C have been measured. These experiments were used to determine how the capacitor MIS model parameters are changed during ageing at elevated temperature and to receive information on the DCL conduction mechanism. The leakage current changes in the high electric field and at the elevated temperature could be divided into three time intervals: (i) DCL is stable (in some samples is slightly changing) during a period up to 200 hours, (ii) DCL increases with the slope 5 to10 pA/s for time interval about 100 hours, (iii) DCL is stable or slightly increases with the slope less than 1 pA/s. The DCL values after life testing for 1000 h increase for some samples by more than 1 order of magnitude.

English abstract

Electromigration of mobile ions in tantalum capacitors at various temperatures and biases was investigated. An analysis of the charge carrier transport was performed to describe the leakage current (DCL) kinetics at high temperature and high electric field for MnO2 and conducting polymer (CP) cathodes. I-V characteristics in normal and reverse mode in the temperature range from 27 to 140 C have been measured. These experiments were used to determine how the capacitor MIS model parameters are changed during ageing at elevated temperature and to receive information on the DCL conduction mechanism. The leakage current changes in the high electric field and at the elevated temperature could be divided into three time intervals: (i) DCL is stable (in some samples is slightly changing) during a period up to 200 hours, (ii) DCL increases with the slope 5 to10 pA/s for time interval about 100 hours, (iii) DCL is stable or slightly increases with the slope less than 1 pA/s. The DCL values after life testing for 1000 h increase for some samples by more than 1 order of magnitude.

Keywords

Electro migration, mobile ions, tantalum capacitors, leakage current, MIS model

RIV year

2012

Released

28.06.2012

Publisher

IMAPS CZ&SK

ISBN

978-80-214-4539-0

Book

EDS 2012 Proceedings

Pages from

343

Pages to

348

Pages count

6

BibTex


@inproceedings{BUT95975,
  author="Vlasta {Sedláková} and Jiří {Majzner} and Josef {Šikula} and Dr. Alexander {Teverovsky} and Tomáš {Zedníček}",
  title="IONS ELECTROMIGRATION IN TANTALUM CAPACITORS",
  annote="Electromigration of mobile ions in tantalum capacitors at various temperatures and biases was investigated. An analysis of the charge carrier transport was performed to describe the leakage current (DCL) kinetics at high temperature and high electric field for MnO2 and conducting polymer (CP) cathodes. I-V characteristics in normal and reverse mode in the temperature range from 27 to 140 C have been measured. These experiments were used to determine how the capacitor MIS model parameters are changed during ageing at elevated temperature and to receive information on the DCL conduction mechanism. The leakage current changes in the high electric field and at the elevated temperature could be divided into three time intervals: (i) DCL is stable (in some samples is slightly changing) during a period up to 200 hours, (ii) DCL increases with the slope 5 to10 pA/s for time interval about 100 hours, (iii) DCL is stable or slightly increases with the slope less than 1 pA/s. The DCL values after life testing for 1000 h increase for some samples by more than 1 order of magnitude.",
  address="IMAPS CZ&SK",
  booktitle="EDS 2012 Proceedings",
  chapter="95975",
  howpublished="print",
  institution="IMAPS CZ&SK",
  year="2012",
  month="june",
  pages="343--348",
  publisher="IMAPS CZ&SK",
  type="conference paper"
}