Publication detail

The effect of silver diffusion from contact electrode into thick film resistors

SEDLÁKOVÁ, V., MELKES, F., GRMELA, L., DOBIS, P., ŠIKULA, J., TACANO, M., ROČAK, D., BELAVIČ, D.

Original Title

The effect of silver diffusion from contact electrode into thick film resistors

Czech Title

Vliv difuze stříbra do odporové vrstvy na charakteristiky tlustovrstvového odporu

English Title

The effect of silver diffusion from contact electrode into thick film resistors

Type

conference paper

Language

en

Original Abstract

We investigate the effect of silver diffusion and migration from contact electrode into thick film resistive layer and its influence on resistor stability. Silver diffusion results to the resistive layer conductivity increase in the vicinity of contact. This leads to effective shortening of thick film resistor length and lowering of the electric field intensity near the contact. The noise spectroscopy and third harmonic measurements were used to investigate this effect. Numerical model of current density and electric field distribution was performed to estimate the influence of silver diffusion and migration.

Czech abstract

We investigate the effect of silver diffusion and migration from contact electrode into thick film resistive layer and its influence on resistor stability. Silver diffusion results to the resistive layer conductivity increase in the vicinity of contact. This leads to effective shortening of thick film resistor length and lowering of the electric field intensity near the contact. The noise spectroscopy and third harmonic measurements were used to investigate this effect. Numerical model of current density and electric field distribution was performed to estimate the influence of silver diffusion and migration.

English abstract

We investigate the effect of silver diffusion and migration from contact electrode into thick film resistive layer and its influence on resistor stability. Silver diffusion results to the resistive layer conductivity increase in the vicinity of contact. This leads to effective shortening of thick film resistor length and lowering of the electric field intensity near the contact. The noise spectroscopy and third harmonic measurements were used to investigate this effect. Numerical model of current density and electric field distribution was performed to estimate the influence of silver diffusion and migration.

Keywords

Noise, Non-linearity, Thick film

RIV year

2003

Released

01.01.2003

Publisher

Electronic Components Institute Internationale Ltd.

Location

United Kingdom

ISBN

0887-7491

Book

CARTS - EUROPE 2003 Proceedings

Pages from

201

Pages to

204

Pages count

4

BibTex


@inproceedings{BUT9064,
  author="Vlasta {Sedláková} and František {Melkes} and Lubomír {Grmela} and Pavel {Dobis} and Josef {Šikula} and Munecazu {Tacano} and Dubravka {Ročak} and Darko {Belavič}",
  title="The effect of silver diffusion from contact electrode into thick film resistors",
  annote="We investigate the effect of silver diffusion and migration from contact electrode into thick film resistive layer and its influence on resistor stability. Silver diffusion results to the resistive layer conductivity increase in the vicinity of contact. This leads to effective shortening of thick film resistor length and lowering of the electric field intensity near the contact. The noise spectroscopy and third harmonic measurements were used to investigate this effect. Numerical model of current density and electric field distribution was performed to estimate the influence of silver diffusion and migration.",
  address="Electronic Components Institute Internationale Ltd.",
  booktitle="CARTS - EUROPE 2003 Proceedings",
  chapter="9064",
  institution="Electronic Components Institute Internationale Ltd.",
  year="2003",
  month="january",
  pages="201",
  publisher="Electronic Components Institute Internationale Ltd.",
  type="conference paper"
}