Publication detail

Low Frequency Noise and Third Harmonic Testing of Thick Film Resistors as Reliability Indicators

SEDLÁKOVÁ, V. PAVELKA, J. ŠIKULA, J. ROČAK, D. HROVAT, M. BELAVIČ, D.

Original Title

Low Frequency Noise and Third Harmonic Testing of Thick Film Resistors as Reliability Indicators

English Title

Low Frequency Noise and Third Harmonic Testing of Thick Film Resistors as Reliability Indicators

Type

conference paper

Language

en

Original Abstract

The noise spectroscopy measurement and third harmonic testing of thick film layers are proposed as a diagnostic tool for the prediction of possible types of failure. The correlation between long term stability and current noise and third harmonic index was investigated.

English abstract

The noise spectroscopy measurement and third harmonic testing of thick film layers are proposed as a diagnostic tool for the prediction of possible types of failure. The correlation between long term stability and current noise and third harmonic index was investigated.

Keywords

noise

RIV year

2001

Released

01.01.2001

Publisher

World Scientific

Location

Gainesville, Florida, USA

ISBN

981-02-4677-3

Book

Proceedings of the 16th International Conference Noise in Physical Systems and 1/f Fluctuations ICNF 2001

Pages from

747

Pages to

750

Pages count

4

BibTex


@inproceedings{BUT6857,
  author="Vlasta {Sedláková} and Jan {Pavelka} and Josef {Šikula} and Dubravka {Ročak} and Marko {Hrovat} and Darko {Belavič}",
  title="Low Frequency Noise and Third Harmonic Testing of Thick Film Resistors as Reliability Indicators",
  annote="The noise spectroscopy measurement and third harmonic testing of thick film layers are proposed as a diagnostic tool for the prediction of possible types of failure. The correlation between long term stability and current noise and third harmonic index was investigated.",
  address="World Scientific",
  booktitle="Proceedings of the 16th International Conference Noise in Physical Systems and 1/f Fluctuations ICNF 2001",
  chapter="6857",
  institution="World Scientific",
  year="2001",
  month="january",
  pages="747",
  publisher="World Scientific",
  type="conference paper"
}