Publication detail

Low Frequency Noise and Third Harmonic Testing of Thick Film Resistors as Reliability Indicators

SEDLÁKOVÁ, V. PAVELKA, J. ŠIKULA, J. ROČAK, D. HROVAT, M. BELAVIČ, D.

Original Title

Low Frequency Noise and Third Harmonic Testing of Thick Film Resistors as Reliability Indicators

Type

conference paper

Language

English

Original Abstract

The noise spectroscopy measurement and third harmonic testing of thick film layers are proposed as a diagnostic tool for the prediction of possible types of failure. The correlation between long term stability and current noise and third harmonic index was investigated.

Keywords

noise

Authors

SEDLÁKOVÁ, V.; PAVELKA, J.; ŠIKULA, J.; ROČAK, D.; HROVAT, M.; BELAVIČ, D.

RIV year

2001

Released

1. 1. 2001

Publisher

World Scientific

Location

Gainesville, Florida, USA

ISBN

981-02-4677-3

Book

Proceedings of the 16th International Conference Noise in Physical Systems and 1/f Fluctuations ICNF 2001

Pages from

747

Pages to

750

Pages count

4

BibTex

@inproceedings{BUT6857,
  author="Vlasta {Sedláková} and Jan {Pavelka} and Josef {Šikula} and Dubravka {Ročak} and Marko {Hrovat} and Darko {Belavič}",
  title="Low Frequency Noise and Third Harmonic Testing of Thick Film Resistors as Reliability Indicators",
  booktitle="Proceedings of the 16th International Conference Noise in Physical Systems and 1/f Fluctuations ICNF 2001",
  year="2001",
  pages="4",
  publisher="World Scientific",
  address="Gainesville, Florida, USA",
  isbn="981-02-4677-3"
}