Publication detail

Near-field optical microscopy diagnostics

TOMÁNEK, P., OTEVŘELOVÁ, D., GRMELA, L., DOBIS, P.

Original Title

Near-field optical microscopy diagnostics

English Title

Near-field optical microscopy diagnostics

Type

conference paper

Language

en

Original Abstract

A simple experimental set-up with SNOM allows obtain the photoluminescence spectra, integrated photoluminescence intensity, electroluminescence intensity and photocurrent spectroscopy only by a simple changing of connection. We used here a combination of reflection SNOM and of internal photoemission as well as of photoluminescence to investigate one of the major problems in today solid state physics: the lateral variations of solid interface properties. The method is well-founded to reach the spatially resolved photoemission on the Au/GaAs Schottky barrier or the spectral photoluminescent intensity on the nanometer scale. The preliminary experimental results of the multidiagnostic of semiconductor surface will be presented in this paper.

English abstract

A simple experimental set-up with SNOM allows obtain the photoluminescence spectra, integrated photoluminescence intensity, electroluminescence intensity and photocurrent spectroscopy only by a simple changing of connection. We used here a combination of reflection SNOM and of internal photoemission as well as of photoluminescence to investigate one of the major problems in today solid state physics: the lateral variations of solid interface properties. The method is well-founded to reach the spatially resolved photoemission on the Au/GaAs Schottky barrier or the spectral photoluminescent intensity on the nanometer scale. The preliminary experimental results of the multidiagnostic of semiconductor surface will be presented in this paper.

Keywords

near-field optics, near-field optical microscope, multidiagnostics, semiconductor interaface

RIV year

2001

Released

28.06.2001

Publisher

Faculty of Physics, Warszaw University

Location

Warszaw

ISBN

83-913171-4-5

Book

From quantum optics to photonics

Pages from

90

Pages to

90

Pages count

1

BibTex


@inproceedings{BUT6603,
  author="Pavel {Tománek} and Dana {Otevřelová} and Lubomír {Grmela} and Pavel {Dobis}",
  title="Near-field optical microscopy diagnostics",
  annote="A simple experimental set-up with SNOM allows obtain the photoluminescence spectra, integrated photoluminescence intensity, electroluminescence intensity and photocurrent spectroscopy only by a simple changing of connection. We used here a combination of reflection SNOM and of internal photoemission as well as of photoluminescence to investigate one of the major problems in today solid state physics: the lateral variations of solid interface properties. The method is well-founded to reach the spatially resolved photoemission on the Au/GaAs Schottky barrier or the spectral photoluminescent intensity on the nanometer scale.
The preliminary experimental results of the multidiagnostic of semiconductor surface will be presented in this paper.",
  address="Faculty of Physics, Warszaw University",
  booktitle="From quantum optics to photonics",
  chapter="6603",
  institution="Faculty of Physics, Warszaw University",
  year="2001",
  month="june",
  pages="90",
  publisher="Faculty of Physics, Warszaw University",
  type="conference paper"
}