Publication detail

Near-field optical microscopy diagnostics

TOMÁNEK, P., OTEVŘELOVÁ, D., GRMELA, L., DOBIS, P.

Original Title

Near-field optical microscopy diagnostics

Type

conference paper

Language

English

Original Abstract

A simple experimental set-up with SNOM allows obtain the photoluminescence spectra, integrated photoluminescence intensity, electroluminescence intensity and photocurrent spectroscopy only by a simple changing of connection. We used here a combination of reflection SNOM and of internal photoemission as well as of photoluminescence to investigate one of the major problems in today solid state physics: the lateral variations of solid interface properties. The method is well-founded to reach the spatially resolved photoemission on the Au/GaAs Schottky barrier or the spectral photoluminescent intensity on the nanometer scale. The preliminary experimental results of the multidiagnostic of semiconductor surface will be presented in this paper.

Key words in English

near-field optics, near-field optical microscope, multidiagnostics, semiconductor interaface

Authors

TOMÁNEK, P., OTEVŘELOVÁ, D., GRMELA, L., DOBIS, P.

RIV year

2001

Released

28. 6. 2001

Publisher

Faculty of Physics, Warszaw University

Location

Warszaw

ISBN

83-913171-4-5

Book

From quantum optics to photonics

Pages from

90

Pages to

90

Pages count

1

BibTex

@inproceedings{BUT6603,
  author="Pavel {Tománek} and Dana {Otevřelová} and Lubomír {Grmela} and Pavel {Dobis}",
  title="Near-field optical microscopy diagnostics",
  booktitle="From quantum optics to photonics",
  year="2001",
  pages="1",
  publisher="Faculty of Physics, Warszaw University",
  address="Warszaw",
  isbn="83-913171-4-5"
}