Publication detail

Near-field optical measurement and sensing in Nanophotonics

TOMÁNEK, P. GRMELA, L.

Original Title

Near-field optical measurement and sensing in Nanophotonics

Czech Title

Využití optického blízkého pole pro měření a nanofotonické senzory

English Title

Near-field optical measurement and sensing in Nanophotonics

Type

abstract

Language

en

Original Abstract

The current progress in semiconductor optoelectronics, laser diodes, fast photodetectors, optical modulators, MEMS and MOEMS technology, micro- and nano-electronics development and optical manufacturing technology opens new and improved perspectives for optical sensors and measuring systems, which integrate several components in order to achieve new functionalities. To measure local characteristics of these devices, the use of near-field optics is very important because the coupling of the evanescent electromagnetic field and the radiative electromagnetic waves in the vicinity of a nano-probe placed near the boundary between allows overcome the diffraction limit of light of conventional optics. This technique could be useful to the measurement and sensing of local optical and electro-optical characteristics in nanoscience. The paper brings an overview of several methods using the contrast mechanisms in optical near-field to characterize nanophotonic devices.

Czech abstract

Současný rozvoj polovodičové optoelektroniky, směřující k využití nanomateriálů a nanosuočástek umožňuje perspektivní využití optických senzorů a měřicích systémů, které zahrnou více součástek na jednom čipu a dosáhnou vyšší funkčnosti. U těchto součástek je nezbytné měřit jejich lokální charakteristiky, proto se jecí výhodným použít metody optického blízkého pole jednak pro měření jednak pro senzory. Zvaná přednáška přináší přehled několika metod využívajících měření lokálního kontrastu pro charakterizaci nanofotonických zařízení.

English abstract

The current progress in semiconductor optoelectronics, laser diodes, fast photodetectors, optical modulators, MEMS and MOEMS technology, micro- and nano-electronics development and optical manufacturing technology opens new and improved perspectives for optical sensors and measuring systems, which integrate several components in order to achieve new functionalities. To measure local characteristics of these devices, the use of near-field optics is very important because the coupling of the evanescent electromagnetic field and the radiative electromagnetic waves in the vicinity of a nano-probe placed near the boundary between allows overcome the diffraction limit of light of conventional optics. This technique could be useful to the measurement and sensing of local optical and electro-optical characteristics in nanoscience. The paper brings an overview of several methods using the contrast mechanisms in optical near-field to characterize nanophotonic devices.

Keywords

Nanophotonics, nanooptics, optical sensor, contrasts, near-field optical microscope, optical fiber probe, measurement, sensing

Released

10.10.2006

Publisher

Wroclaw University of Technology

Location

Wroclaw, Poland

Pages from

40

Pages to

40

Pages count

1

URL

BibTex


@misc{BUT60394,
  author="Pavel {Tománek} and Lubomír {Grmela}",
  title="Near-field optical measurement and sensing in Nanophotonics",
  annote="The current progress in semiconductor optoelectronics, laser diodes, fast photodetectors, optical modulators, MEMS and MOEMS technology, micro- and nano-electronics development and optical manufacturing technology opens new and improved perspectives for optical sensors and measuring systems, which integrate several components in order to achieve new functionalities. To measure local characteristics of these devices, the use of near-field optics is very important because the coupling of the evanescent electromagnetic field and the radiative electromagnetic waves in the vicinity of a nano-probe placed near the boundary between allows overcome the diffraction limit of light of conventional optics.  This technique could be useful to the measurement and sensing of local optical and electro-optical characteristics in nanoscience. The paper brings an overview of several methods using the contrast mechanisms in optical near-field to characterize nanophotonic devices.",
  address="Wroclaw University of Technology",
  chapter="60394",
  institution="Wroclaw University of Technology",
  year="2006",
  month="october",
  pages="40",
  publisher="Wroclaw University of Technology",
  type="abstract"
}