Publication detail

Near-Field Induced Photocurrent Spectra: New Way of Non-destructive Testing of DQW-GRIN Laser Diodes Reliability

GRMELA, L., DOBIS, P., TOMÁNEK, P.

Original Title

Near-Field Induced Photocurrent Spectra: New Way of Non-destructive Testing of DQW-GRIN Laser Diodes Reliability

English Title

Near-Field Induced Photocurrent Spectra: New Way of Non-destructive Testing of DQW-GRIN Laser Diodes Reliability

Type

conference paper

Language

en

Original Abstract

We present the comparative study of spatially resolved near-field photocurrent (NPC) spectra for high power laser diode arrays with double quantum well before and after degradation due to the aging process. Subwavelength spatial resolution is established using a single mode fiber probe as an excitation source. The potential of the technique for analyzing microscopic aging processes in optoelectronic devices is demonstrated. The nondestructive quality of this method is a particularly attractive for in-situ analysis of the structures.

English abstract

We present the comparative study of spatially resolved near-field photocurrent (NPC) spectra for high power laser diode arrays with double quantum well before and after degradation due to the aging process. Subwavelength spatial resolution is established using a single mode fiber probe as an excitation source. The potential of the technique for analyzing microscopic aging processes in optoelectronic devices is demonstrated. The nondestructive quality of this method is a particularly attractive for in-situ analysis of the structures.

Keywords

DQW-GRIN laser diode, degradation, aging process, optical near-field, photocurrent spectra.

RIV year

2002

Released

01.07.2002

Publisher

Ing. Zdeněk Novotný, CSc.

Location

Brno

ISBN

80-238-9094-8

Book

Noise and Non-linearity Testing of Modern Electronic Components

Pages from

129

Pages to

133

Pages count

5

BibTex


@inproceedings{BUT5707,
  author="Lubomír {Grmela} and Pavel {Dobis} and Pavel {Tománek}",
  title="Near-Field Induced Photocurrent Spectra: New Way of Non-destructive Testing of DQW-GRIN Laser Diodes Reliability",
  annote="We present the comparative study of spatially resolved near-field photocurrent (NPC) spectra for high power laser diode arrays with double quantum well before and after degradation due to the aging process. Subwavelength spatial resolution is established using a single mode fiber probe as an excitation source. The potential of the technique for analyzing microscopic aging processes in optoelectronic devices is demonstrated. The nondestructive quality of this method is a particularly attractive for in-situ analysis of the structures.",
  address="Ing. Zdeněk Novotný, CSc.",
  booktitle="Noise and Non-linearity Testing of Modern Electronic Components",
  chapter="5707",
  institution="Ing. Zdeněk Novotný, CSc.",
  year="2002",
  month="july",
  pages="129",
  publisher="Ing. Zdeněk Novotný, CSc.",
  type="conference paper"
}