Publication detail

Spectral measurements of semiconductor structures using optical near-field approach

TOMÁNEK, P., BENEŠOVÁ, M., DOBIS, P., OTEVŘELOVÁ, D., GRMELA, L.

Original Title

Spectral measurements of semiconductor structures using optical near-field approach

Type

conference paper

Language

English

Original Abstract

The measurements of local photoluminescence, local photocurrent on GaAs/AlGaAs quantum wells under ambient temperature 300 K have been performed. The level of the locally induced signal in function excitation energy, probe-sample distance and sample position has been studied. The method is relevant to the study of the local defects, to evaluate the aging process of devices.

Keywords

Semiconductor structures, quantum well, near-field, spectroscopy

Authors

TOMÁNEK, P., BENEŠOVÁ, M., DOBIS, P., OTEVŘELOVÁ, D., GRMELA, L.

RIV year

2003

Released

25. 4. 2002

Publisher

KU Leuven, COST 523

Location

Leuven, Belgie

Pages from

P55

Pages count

1