Publication detail

Non Destructive Testing of Thinck Film Electroluminiscent Lamps

GRMELA, L., KOKTAVÝ, P., LIEDERMANN, K., ŠIKULA, J., PAVELKA, J., TOMÁNEK, P.

Original Title

Non Destructive Testing of Thinck Film Electroluminiscent Lamps

English Title

Non Destructive Testing of Thinck Film Electroluminiscent Lamps

Type

conference paper

Language

en

Original Abstract

Non destructive testing of thick film electroluminiscent lamps is based on electric charge transport characteristics and electronic noise spectroscopy. We report on noise spectroscopy used to estimate the quality and reliability of thick electroluminiscent layers

English abstract

Non destructive testing of thick film electroluminiscent lamps is based on electric charge transport characteristics and electronic noise spectroscopy. We report on noise spectroscopy used to estimate the quality and reliability of thick electroluminiscent layers

Keywords

Noise, electroluminiscent lamp, degradation, agening

RIV year

2002

Released

01.07.2002

Publisher

European Federation for Non-Destructive Testing

Location

Madrid

ISBN

84-699-8573-6

Book

8-th ECNDT, Barcelona

Pages from

214

Pages to

215

Pages count

2

BibTex


@inproceedings{BUT5384,
  author="Lubomír {Grmela} and Pavel {Koktavý} and Karel {Liedermann} and Josef {Šikula} and Jan {Pavelka} and Pavel {Tománek}",
  title="Non Destructive Testing of Thinck Film Electroluminiscent Lamps",
  annote="Non destructive testing of thick film electroluminiscent lamps is based on electric charge transport characteristics and electronic noise spectroscopy. We report on noise spectroscopy used to estimate the quality and reliability of thick electroluminiscent layers",
  address="European Federation for Non-Destructive Testing",
  booktitle="8-th ECNDT, Barcelona",
  chapter="5384",
  institution="European Federation for Non-Destructive Testing",
  year="2002",
  month="july",
  pages="214",
  publisher="European Federation for Non-Destructive Testing",
  type="conference paper"
}