Publication detail

Signal and Power Integrity: A Problem for Design and CAD Engineers

MUSIL, V., BAJER, A., PROKOP, R.

Original Title

Signal and Power Integrity: A Problem for Design and CAD Engineers

English Title

Signal and Power Integrity: A Problem for Design and CAD Engineers

Type

conference paper

Language

en

Original Abstract

Signal and power integrity is no longer an issue for microprocessor and radio frequency designers. As technology scales, clock frequencies rise, and the need for higher integration of analog and digital IP blocks increases, unvanted parasitic effects become more and more a gating factor to IC design project success. Many of these effects can be prevented or analyzed and fixed in isolation, but increasingly they are becoming highly dependent on ech other.

English abstract

Signal and power integrity is no longer an issue for microprocessor and radio frequency designers. As technology scales, clock frequencies rise, and the need for higher integration of analog and digital IP blocks increases, unvanted parasitic effects become more and more a gating factor to IC design project success. Many of these effects can be prevented or analyzed and fixed in isolation, but increasingly they are becoming highly dependent on ech other.

Keywords

signal and power integrity, parasitic effects, IC design

RIV year

2002

Released

01.01.2002

Publisher

Vysoké učení technické v Brně

Location

Brno

ISBN

80-214-2180-0

Book

ELECTRONIC DEVICES AND SYSTEMS 02 - PROCEEDINGS

Edition number

1

Pages from

267

Pages to

279

Pages count

13

BibTex


@inproceedings{BUT4959,
  author="Vladislav {Musil} and Arnošt {Bajer} and Roman {Prokop}",
  title="Signal and Power Integrity: A Problem for Design and CAD Engineers",
  annote="Signal and power integrity is no longer an issue for microprocessor and radio frequency designers. As technology scales, clock frequencies rise, and the need for higher integration of analog and digital IP blocks increases, unvanted parasitic effects become more and more a gating factor to IC design project success. Many of these effects can be prevented or analyzed and fixed in isolation, but increasingly they are becoming highly dependent on ech other.",
  address="Vysoké učení technické v Brně",
  booktitle="ELECTRONIC DEVICES AND SYSTEMS 02 - PROCEEDINGS",
  chapter="4959",
  institution="Vysoké učení technické v Brně",
  year="2002",
  month="january",
  pages="267",
  publisher="Vysoké učení technické v Brně",
  type="conference paper"
}