Publication detail

Near-field measurement of ZnS:Mn nanocrystal and bulk thin-film electroluminescent devices

GRMELA, L. MACKŮ, R. TOMÁNEK, P.

Original Title

Near-field measurement of ZnS:Mn nanocrystal and bulk thin-film electroluminescent devices

Czech Title

Měření ZnS:Mn nanokrystalů a objemových tenkých vrstev elektroluminiscenčních součástek v blízkém poli

English Title

Near-field measurement of ZnS:Mn nanocrystal and bulk thin-film electroluminescent devices

Type

journal article

Language

en

Original Abstract

A study of the electro-optical and aging characteristics of nanostructured and bulk ZnS:Mn ACTFEL devices is presented. ZnS:Mn nanocrystals contain four different concentrations of Mn (from 0.05 to 1.0 wt%). Almost all previous measurements have been done in the far-field, therefore a local study of optical near-field of samples was applied. Although the electro-optic performance and aging behavior of these devices is rather good, the luminous efficiency is currently not sufficient to justify commercialization of this phosphor. SNOM technique has shown to be extremely important characterization tools for nanostructured materials, not only for engineered semiconductor materials but for molecular-based nanostructures as well.

Czech abstract

Ve článku je prezentováno studium elektrooptických jevů tenkovrstvých elektrooptických součástek v blízkém poli a charakteristiky stárnutí nanostruktur a objemových ZnS:Mn. ZnS:Mn nanokrystaly vložené ve skleněné matrici stejně jako ZnS:Mn tenkovrstvý luminofor obsahuje čtyři různé koncentrace Mn (od 0.05 do 1.0 mol%). Aktivační nečistoty v luminoforu ovlivňují ve velkém rozsahu spektrální vlastnosti, časové vlastnosti optické emise a proces stárnutí součástek. Proto je sledována lokální fotoluminiscence a elektroluminiscence metodou využívající optické mikroskopie v blízkém poli společně s charakteristikami stárnutí ZnS:Mn nanokrystalických struktur.

English abstract

A study of the electro-optical and aging characteristics of nanostructured and bulk ZnS:Mn ACTFEL devices is presented. ZnS:Mn nanocrystals contain four different concentrations of Mn (from 0.05 to 1.0 wt%). Almost all previous measurements have been done in the far-field, therefore a local study of optical near-field of samples was applied. Although the electro-optic performance and aging behavior of these devices is rather good, the luminous efficiency is currently not sufficient to justify commercialization of this phosphor. SNOM technique has shown to be extremely important characterization tools for nanostructured materials, not only for engineered semiconductor materials but for molecular-based nanostructures as well.

Keywords

Electroluminescence, luminescence centers, nanocrystal, phosphors, photoluminescence, scanning near-field optical microscopy, ZnS:Mn

RIV year

2008

Released

01.02.2008

Publisher

Blackwell Publishing

Location

London

Pages from

275

Pages to

280

Pages count

6

BibTex


@article{BUT44530,
  author="Lubomír {Grmela} and Robert {Macků} and Pavel {Tománek}",
  title="Near-field measurement of ZnS:Mn nanocrystal and bulk thin-film electroluminescent devices",
  annote="A study of the electro-optical and aging characteristics of nanostructured  and bulk ZnS:Mn ACTFEL devices is presented. ZnS:Mn nanocrystals contain four different concentrations of Mn (from 0.05 to 1.0  wt%). Almost all previous measurements have been done in the far-field, therefore a local study of optical near-field of samples was applied.  Although the electro-optic performance and aging behavior of these devices is rather good, the luminous efficiency is currently not sufficient to justify commercialization of this phosphor. SNOM technique has shown to be extremely important characterization tools for nanostructured materials, not only for engineered semiconductor materials but for molecular-based nanostructures as well.",
  address="Blackwell Publishing",
  chapter="44530",
  institution="Blackwell Publishing",
  number="2",
  volume="229",
  year="2008",
  month="february",
  pages="275--280",
  publisher="Blackwell Publishing",
  type="journal article"
}