Publication detail

Noise and transport characterisation of tantalum capacitors

PAVELKA, J. ŠIKULA, J. VAŠINA, P. SEDLÁKOVÁ, V. TACANO, M. HASHIGUCHI, S.

Original Title

Noise and transport characterisation of tantalum capacitors

Type

journal article - other

Language

English

Original Abstract

Noise and transport characterisation of tantalum capacitors

Keywords

noise, reliability, tantalum capacitors

Authors

PAVELKA, J.; ŠIKULA, J.; VAŠINA, P.; SEDLÁKOVÁ, V.; TACANO, M.; HASHIGUCHI, S.

Released

1. 1. 2002

ISBN

0026-2714

Periodical

Microelectronics Reliability

Year of study

42

Number

6

State

United Kingdom of Great Britain and Northern Ireland

Pages from

841

Pages to

847

Pages count

7

BibTex

@article{BUT43782,
  author="Jan {Pavelka} and Josef {Šikula} and Petr {Vašina} and Vlasta {Sedláková} and Munecazu {Tacano} and Sumihisa {Hashiguchi}",
  title="Noise and transport characterisation of tantalum capacitors",
  journal="Microelectronics Reliability",
  year="2002",
  volume="42",
  number="6",
  pages="7",
  issn="0026-2714"
}