Publication detail

Noise and transport characterisation of tantalum capacitors

PAVELKA, J. ŠIKULA, J. VAŠINA, P. SEDLÁKOVÁ, V. TACANO, M. HASHIGUCHI, S.

Original Title

Noise and transport characterisation of tantalum capacitors

English Title

Noise and transport characterisation of tantalum capacitors

Type

journal article - other

Language

en

Original Abstract

Noise and transport characterisation of tantalum capacitors

English abstract

Noise and transport characterisation of tantalum capacitors

Keywords

noise, reliability, tantalum capacitors

Released

01.01.2002

ISBN

0026-2714

Periodical

Microelectronics Reliability

Year of study

42

Number

6

State

GB

Pages from

841

Pages to

847

Pages count

7

Documents

BibTex


@article{BUT43782,
  author="Jan {Pavelka} and Josef {Šikula} and Petr {Vašina} and Vlasta {Sedláková} and Munecazu {Tacano} and Sumihisa {Hashiguchi}",
  title="Noise and transport characterisation of tantalum capacitors",
  annote="Noise and transport characterisation of tantalum capacitors",
  chapter="43782",
  number="6",
  volume="42",
  year="2002",
  month="january",
  pages="841",
  type="journal article - other"
}