Publication detail
Noise and transport characterisation of tantalum capacitors
PAVELKA, J. ŠIKULA, J. VAŠINA, P. SEDLÁKOVÁ, V. TACANO, M. HASHIGUCHI, S.
Original Title
Noise and transport characterisation of tantalum capacitors
English Title
Noise and transport characterisation of tantalum capacitors
Type
journal article - other
Language
en
Original Abstract
Noise and transport characterisation of tantalum capacitors
English abstract
Noise and transport characterisation of tantalum capacitors
Keywords
noise, reliability, tantalum capacitors
Released
01.01.2002
ISBN
0026-2714
Periodical
Microelectronics Reliability
Year of study
42
Number
6
State
GB
Pages from
841
Pages to
847
Pages count
7
Documents
BibTex
@article{BUT43782,
author="Jan {Pavelka} and Josef {Šikula} and Petr {Vašina} and Vlasta {Sedláková} and Munecazu {Tacano} and Sumihisa {Hashiguchi}",
title="Noise and transport characterisation of tantalum capacitors",
annote="Noise and transport characterisation of tantalum capacitors",
chapter="43782",
number="6",
volume="42",
year="2002",
month="january",
pages="841",
type="journal article - other"
}