Publication detail

Noise and Non-Linearity as Reliability Indicators of Electronic Devices

ŠIKULA, J., SEDLÁKOVÁ, V., DOBIS, P.

Original Title

Noise and Non-Linearity as Reliability Indicators of Electronic Devices

Type

journal article - other

Language

English

Original Abstract

An application of noise and non-linearity measurements in analysis, diagnostics and prediction of reliability of electronic devices is discussed. The sensitivity of noise and non-linearity to the device defects and other irregularities is typical feature of these methods. The principles of noise and non-linearity measuring set-up are shown. Conceptions of 1/f noise, burst or RTS noise, thermal noise and third harmonic voltage are described and theirs explanation is done. Possible reliability indicators for conducting film resistors, MOSFETs and quantum dots are presented.

Keywords

Noise, non-linearity, reliability indicators.

Authors

ŠIKULA, J., SEDLÁKOVÁ, V., DOBIS, P.

RIV year

2004

Released

1. 1. 2004

ISBN

0352-9045

Periodical

Informacije MIDEM

Year of study

2003

Number

4

State

Republic of Slovenia

Pages from

213

Pages to

221

Pages count

9

BibTex

@article{BUT42097,
  author="Josef {Šikula} and Vlasta {Sedláková} and Pavel {Dobis}",
  title="Noise and Non-Linearity as Reliability Indicators of Electronic Devices",
  journal="Informacije MIDEM",
  year="2004",
  volume="2003",
  number="4",
  pages="213--221",
  issn="0352-9045"
}