Publication detail

Noise and Self-Healing of Tantalum Capacitors

PAVELKA, J., ŠIKULA, J., GRMELA, L., TACANO, M., HASHIGUCHI, S.

Original Title

Noise and Self-Healing of Tantalum Capacitors

English Title

Noise and Self-Healing of Tantalum Capacitors

Type

journal article

Language

en

Original Abstract

We present the comparative study of spatially resolved near-field photocurrent (NPC) spectra for high power laser diode arrays with double quantum well before and after degradation due to the aging process. Subwavelength spatial resolution is established using a single mode fiber probe as an excitation source. The potential of the technique for analyzing microscopic aging processes in optoelectronic devices is demonstrated. The nondestructive quality of this method is a particularly attractive for in-situ analysis of the structures.

English abstract

We present the comparative study of spatially resolved near-field photocurrent (NPC) spectra for high power laser diode arrays with double quantum well before and after degradation due to the aging process. Subwavelength spatial resolution is established using a single mode fiber probe as an excitation source. The potential of the technique for analyzing microscopic aging processes in optoelectronic devices is demonstrated. The nondestructive quality of this method is a particularly attractive for in-situ analysis of the structures.

Keywords

self-healing, noise, reliability, tantalum capacitor

RIV year

2002

Released

01.04.2002

Pages from

181

Pages to

185

Pages count

5

BibTex


@article{BUT40847,
  author="Jan {Pavelka} and Josef {Šikula} and Lubomír {Grmela} and Munecazu {Tacano} and Sumihisa {Hashiguchi}",
  title="Noise and Self-Healing of Tantalum Capacitors",
  annote="We present the comparative study of spatially resolved near-field photocurrent (NPC) spectra for high power laser diode arrays with double quantum well before and after degradation due to the aging process. Subwavelength spatial resolution is established using a single mode fiber probe as an excitation source. The potential of the technique for analyzing microscopic aging processes in optoelectronic devices is demonstrated. The nondestructive quality of this method is a particularly attractive for in-situ analysis of the structures.",
  chapter="40847",
  journal="Capacitors and Resistors Technology",
  number="4/2002",
  volume="2002",
  year="2002",
  month="april",
  pages="181",
  type="journal article"
}