Publication detail

Low-Frequency Noise of Thick-Film Resistors as Quality and Reliability Indicator

ROČAK, D. BELAVIČ, D. HROVAT, M. ŠIKULA, J. KOKTAVÝ, P. PAVELKA, J. SEDLÁKOVÁ, V.

Original Title

Low-Frequency Noise of Thick-Film Resistors as Quality and Reliability Indicator

English Title

Low-Frequency Noise of Thick-Film Resistors as Quality and Reliability Indicator

Type

journal article - other

Language

en

Original Abstract

The non-linearity and the noise of thick-film resistors are parameters that can be used to make prediction of resistor reliability. The noise spectroscopy measurements of thick-film resistors are proposed as a diagnostic tool for the prediction of possible types of failure. The correlation between noise spectral density datat and the results of accelerated aging of thick-film resistors at high temperature were made for HS80 and 2000 resistor pastes.

English abstract

The non-linearity and the noise of thick-film resistors are parameters that can be used to make prediction of resistor reliability. The noise spectroscopy measurements of thick-film resistors are proposed as a diagnostic tool for the prediction of possible types of failure. The correlation between noise spectral density datat and the results of accelerated aging of thick-film resistors at high temperature were made for HS80 and 2000 resistor pastes.

Keywords

noise

RIV year

2001

Released

01.01.2002

Pages from

531

Pages to

542

Pages count

12

BibTex


@article{BUT39801,
  author="Dubravka {Ročak} and Darko {Belavič} and Marko {Hrovat} and Josef {Šikula} and Pavel {Koktavý} and Jan {Pavelka} and Vlasta {Sedláková}",
  title="Low-Frequency Noise of Thick-Film Resistors as Quality and Reliability Indicator",
  annote="The non-linearity and the noise of thick-film resistors are parameters that can be used to make prediction of resistor reliability. The noise spectroscopy measurements of thick-film resistors are proposed as a diagnostic tool for the prediction of possible types of failure. The correlation between noise spectral density datat and the results of accelerated aging of thick-film resistors at high temperature were made for HS80 and 2000 resistor pastes.",
  chapter="39801",
  number="4",
  volume="41",
  year="2002",
  month="january",
  pages="531--542",
  type="journal article - other"
}