Publication detail

Near-field photocurrent spectra in DQW-GRIN laser diodes

GRMELA, L., LÉTAL, P., TOMÁNEK, P.

Original Title

Near-field photocurrent spectra in DQW-GRIN laser diodes

English Title

Near-field photocurrent spectra in DQW-GRIN laser diodes

Type

conference paper

Language

en

Original Abstract

We present the comparative study of spatially resolved near-field photocurrent (NPC) spectra for high power laser diode arrays with double quantum well before and after degradation due to the aging process. Subwavelength spatial resolution is established using a single mode fiber probe as an excitation source. The potential of the technique for analyzing microscopic aging processes in optoelectronic devices is demonstrated. The nondestructive quality of this method is a particularly attractive for in-situ analysis of the structures.

English abstract

We present the comparative study of spatially resolved near-field photocurrent (NPC) spectra for high power laser diode arrays with double quantum well before and after degradation due to the aging process. Subwavelength spatial resolution is established using a single mode fiber probe as an excitation source. The potential of the technique for analyzing microscopic aging processes in optoelectronic devices is demonstrated. The nondestructive quality of this method is a particularly attractive for in-situ analysis of the structures.

Keywords

DQW-GRIN laser diode, degradation, aging process, optical near-field, photoccurent spectra

RIV year

2001

Released

01.01.2001

Publisher

VUT v Brně

Location

Brno

ISBN

80-214-1780-1

Book

Electronic Devices and Systems, EDS'Y2K

Edition number

1

Pages from

213

Pages to

216

Pages count

4

BibTex


@inproceedings{BUT3884,
  author="Lubomír {Grmela} and Petr {Létal} and Pavel {Tománek}",
  title="Near-field photocurrent spectra in DQW-GRIN laser diodes",
  annote="We present the comparative study of spatially resolved near-field photocurrent (NPC) spectra for high power laser diode arrays with double quantum well before and after degradation due to the aging process. Subwavelength spatial resolution is established using a single mode fiber probe as an excitation source. The potential of the technique for analyzing microscopic aging processes in optoelectronic devices is demonstrated. The nondestructive quality of this method is a particularly attractive for in-situ analysis of the structures.",
  address="VUT v Brně",
  booktitle="Electronic Devices and Systems, EDS'Y2K",
  chapter="3884",
  institution="VUT v Brně",
  year="2001",
  month="january",
  pages="213",
  publisher="VUT v Brně",
  type="conference paper"
}