Publication detail

Noise spectroscopy of thick film electroluminescent lamp

GRMELA, L., TOMÁNEK, P., KOKTAVÝ, P., PAVELKA, J., ŠIKULA, J.

Original Title

Noise spectroscopy of thick film electroluminescent lamp

English Title

Noise spectroscopy of thick film electroluminescent lamp

Type

conference paper

Language

en

Original Abstract

Fluctuation of current and light emission in electroluminiscent lamps based of zinc sulfide phosphor powder embedded in a dielectric layer are presented. Noise sources are emission of electron from localised levels in the gap, impact excitation and impact ionozation of luminiscence centers and radiative transition by hot carriers. Due to higt electric field, partial discharges are also sources of current fluctuations.

English abstract

Fluctuation of current and light emission in electroluminiscent lamps based of zinc sulfide phosphor powder embedded in a dielectric layer are presented. Noise sources are emission of electron from localised levels in the gap, impact excitation and impact ionozation of luminiscence centers and radiative transition by hot carriers. Due to higt electric field, partial discharges are also sources of current fluctuations.

Keywords

noise spectroscopy, electroluminescence, thick film, noise density, dielectric powder

Released

13.09.2001

Publisher

Vysoké učení technické v Brně

Location

Brno

ISBN

80-214-1960-1

Book

Electronics Devices and System

Pages from

44

Pages to

44

Pages count

1

BibTex


@inproceedings{BUT3849,
  author="Lubomír {Grmela} and Pavel {Tománek} and Pavel {Koktavý} and Jan {Pavelka} and Josef {Šikula}",
  title="Noise spectroscopy of thick film electroluminescent lamp",
  annote="Fluctuation of current and light emission in electroluminiscent lamps based of zinc sulfide phosphor powder embedded in a dielectric layer are presented. Noise sources are emission of electron from localised levels in the gap, impact excitation and impact ionozation of luminiscence centers and radiative transition by hot carriers. Due to higt electric field, partial discharges are also sources of current fluctuations.",
  address="Vysoké učení technické v Brně",
  booktitle="Electronics Devices and System",
  chapter="3849",
  institution="Vysoké učení technické v Brně",
  year="2001",
  month="september",
  pages="44",
  publisher="Vysoké učení technické v Brně",
  type="conference paper"
}