Publication detail

Characterization of surface corrugation by near-field techniques

TOMÁNEK, P., DOBIS, P., GRMELA, L.

Original Title

Characterization of surface corrugation by near-field techniques

Czech Title

Charakterizování povrchových vlnitostí pomocí technik blízkého pole

English Title

Characterization of surface corrugation by near-field techniques

Type

journal article

Language

en

Original Abstract

When a surface of illuminated object is scanned at a very small distance (a few nanometers) by means of subwavelength nanodetector probe like the very tip of extremity of chemical etched or pulled fiber, topographic images of surface corrugations could be recontructed with a superresolution beyond the diffraction limit. This opportunity due to near field characteristics can be explained in terms of nonradiating field detection that is of optical tunnel effect. Such a nanodetection principle is the basis of near field microscopy techniques.

Czech abstract

Je-li povrch osvětleného předmětu skenován ve velmi malé vzdálenosti (několik nanometrů) pomocí subvlnové nanosondy, jako je hrot optického vlákna, je možné dostat topografické obrázky se superrozlišením lepším než je difrakční mez. Tato možnost v důsledku blízkého pole charakteristik může být vysvětlena pomocí detekce nezářivého pole, které pochází z optického tunelového jevu. Takový princip nanodetekce je základem technik pro blízkopolní mikroskopii.

English abstract

When a surface of illuminated object is scanned at a very small distance (a few nanometers) by means of subwavelength nanodetector probe like the very tip of extremity of chemical etched or pulled fiber, topographic images of surface corrugations could be recontructed with a superresolution beyond the diffraction limit. This opportunity due to near field characteristics can be explained in terms of nonradiating field detection that is of optical tunnel effect. Such a nanodetection principle is the basis of near field microscopy techniques.

Keywords

surface corrugations, topography, near-field techniques, scanning probe microscopy, nanoprobes, nanodetectors, superresolving imagery

RIV year

1995

Released

26.08.1995

Pages from

101

Pages to

102

Pages count

2

BibTex


@article{BUT38445,
  author="Pavel {Tománek} and Pavel {Dobis} and Lubomír {Grmela}",
  title="Characterization of surface corrugation by near-field techniques",
  annote="When a surface of illuminated object is scanned at a very small distance (a few nanometers) by means of subwavelength nanodetector probe like the very tip of extremity of chemical etched or pulled fiber, topographic images of surface corrugations could be recontructed with a superresolution beyond the diffraction limit. This opportunity due to near field characteristics can be explained in terms of nonradiating field detection that is of optical tunnel effect. Such a nanodetection principle is the basis of near field microscopy techniques.",
  chapter="38445",
  howpublished="print",
  journal="EOS Annual Meeting",
  number="2A",
  volume="2A",
  year="1995",
  month="august",
  pages="101--102",
  type="journal article"
}