Publication detail

Fabrication and noise diagnostics of the Schottky and cold emission cathodes covered by thick tungsten oxide layer

KNÁPEK, A. GRMELA, L.

Original Title

Fabrication and noise diagnostics of the Schottky and cold emission cathodes covered by thick tungsten oxide layer

Czech Title

Fabrication and noise diagnostics of the Schottky and cold emission cathodes covered by thick tungsten oxide layer

English Title

Fabrication and noise diagnostics of the Schottky and cold emission cathodes covered by thick tungsten oxide layer

Type

conference paper

Language

cs

Original Abstract

The paper introduces a method for deposition thick oxide layer on to the cold emission cathode and its noise diagnostics. Cathodes based on the Schottky emission are predominant electron source technology for scanning electron microscopy (SEM), transmission electron microscopy (TEM) and Auger systems. Achieving proper results requires an electron source with the following ideal properties: small source size, low electron emission energy spread, high brightness, low noise and long-term stability, simple and low-cost operation. Deposited oxide layer allows to significantly lower work function, which is necessary for increasing cold electron emission current.

Czech abstract

The paper introduces a method for deposition thick oxide layer on to the cold emission cathode and its noise diagnostics. Cathodes based on the Schottky emission are predominant electron source technology for scanning electron microscopy (SEM), transmission electron microscopy (TEM) and Auger systems. Achieving proper results requires an electron source with the following ideal properties: small source size, low electron emission energy spread, high brightness, low noise and long-term stability, simple and low-cost operation. Deposited oxide layer allows to significantly lower work function, which is necessary for increasing cold electron emission current.

English abstract

The paper introduces a method for deposition thick oxide layer on to the cold emission cathode and its noise diagnostics. Cathodes based on the Schottky emission are predominant electron source technology for scanning electron microscopy (SEM), transmission electron microscopy (TEM) and Auger systems. Achieving proper results requires an electron source with the following ideal properties: small source size, low electron emission energy spread, high brightness, low noise and long-term stability, simple and low-cost operation. Deposited oxide layer allows to significantly lower work function, which is necessary for increasing cold electron emission current.

Keywords

Schottky emission, cold emission electron source, noise diagnostics

RIV year

2010

Released

01.09.2010

Publisher

Brno University of Technology

Location

Brno

ISBN

978-80-214-4138-5

Book

IMAPS CS International Conference 2010 - Proceedings

Pages from

156

Pages to

160

Pages count

5

BibTex


@inproceedings{BUT35688,
  author="Alexandr {Knápek} and Lubomír {Grmela}",
  title="Fabrication and noise diagnostics of the Schottky and cold emission cathodes covered by thick tungsten oxide layer",
  annote="The paper introduces a method for deposition thick oxide layer on to the cold emission cathode and its noise diagnostics. Cathodes based on the Schottky emission are predominant electron source technology for scanning electron microscopy (SEM), transmission electron microscopy (TEM) and Auger systems. Achieving proper results requires an electron source with the following ideal properties: small source size, low electron emission energy spread, high brightness, low noise and long-term stability, simple and low-cost operation. Deposited oxide layer allows to significantly lower work function, which is necessary for increasing cold electron emission current.",
  address="Brno University of Technology",
  booktitle="IMAPS CS International Conference 2010 - Proceedings",
  chapter="35688",
  howpublished="print",
  institution="Brno University of Technology",
  year="2010",
  month="september",
  pages="156--160",
  publisher="Brno University of Technology",
  type="conference paper"
}