Publication detail

Physical Demonstration of Polymorphic Self-checking Circuits

RŮŽIČKA, R. SEKANINA, L. PROKOP, R.

Original Title

Physical Demonstration of Polymorphic Self-checking Circuits

Czech Title

Physical Demonstration of Polymorphic Self-checking Circuits

English Title

Physical Demonstration of Polymorphic Self-checking Circuits

Type

conference paper

Language

en

Original Abstract

Polymorphic gates can be considered as a new reconfigurable technology capable of integrating logic functions with sensing in a single compact structure. Polymorphic gates whose logic function can be controlled by the level of the power supply voltage (Vdd) represent a special class of polymorphic gates. A new polymorphic NAND/NOR gate controlled by Vdd is presented. This gate was fabricated and utilized in a self-checking polymorphic adder. This paper presents an experimental evaluation of this novel implementation.

Czech abstract

Polymorfní hradla mohou být chápána jako nová rekonfigurovatelná technologie umožňující integrovat logickou funkci se schopností snímání. Článek představuje nové polymorfní hradlo NAND/NOR řízené úrovní napájecího napětí, výsledky měření provedené na tomto hradle a jeho použití v samočinně testovatelné sčítačce.

English abstract

Polymorphic gates can be considered as a new reconfigurable technology capable of integrating logic functions with sensing in a single compact structure. Polymorphic gates whose logic function can be controlled by the level of the power supply voltage (Vdd) represent a special class of polymorphic gates. A new polymorphic NAND/NOR gate controlled by Vdd is presented. This gate was fabricated and utilized in a self-checking polymorphic adder. This paper presents an experimental evaluation of this novel implementation.

Keywords

digital circuit, polymorphic gate, self-checking, adder

RIV year

2008

Released

15.07.2008

Publisher

IEEE Computer Society

Location

Los Alamitos

ISBN

978-0-7695-3264-6

Book

Proc. of the 14th IEEE Int. On-Line Testing Symposium

Edition

NEUVEDEN

Edition number

NEUVEDEN

Pages from

31

Pages to

36

Pages count

6

BibTex


@inproceedings{BUT30488,
  author="Richard {Růžička} and Lukáš {Sekanina} and Roman {Prokop}",
  title="Physical Demonstration of Polymorphic Self-checking Circuits",
  annote="Polymorphic gates can be considered as a new reconfigurable technology capable of
integrating logic functions with sensing in a single compact structure.
Polymorphic gates whose logic function can be controlled by the level of the
power supply voltage (Vdd) represent a special class of polymorphic gates. A new
polymorphic NAND/NOR gate controlled by Vdd is presented. This gate was
fabricated and utilized in a self-checking polymorphic adder. This paper presents
an experimental evaluation of this novel implementation.",
  address="IEEE Computer Society",
  booktitle="Proc. of the 14th IEEE Int. On-Line Testing Symposium",
  chapter="30488",
  edition="NEUVEDEN",
  howpublished="print",
  institution="IEEE Computer Society",
  year="2008",
  month="july",
  pages="31--36",
  publisher="IEEE Computer Society",
  type="conference paper"
}