Publication detail

Optics of nanoobjects

TOMÁNEK, P. GRMELA, L.

Original Title

Optics of nanoobjects

Czech Title

Optika nanopředmětů

English Title

Optics of nanoobjects

Type

conference paper

Language

en

Original Abstract

Conventional optics is diffraction limited to about half of the effective optical wavelength. However the current trend towards miniaturization of optical elements and devices requires methods of observation with high spatial resolutions adapted to the micrometer and submicrometer optical regime. More specifically, the use of Scanning near-field optical microscope (SNOM or NSOM) in various domains is overviewed. Basically an optical tip with a subwavelength aperture at its apex scans over a surface with a spatial resolution, which is not limited by light diffraction. This characteristic makes SNOM a valuable tool to perform various optical or spectroscopic studies on nanoobjects, such as semiconductor quantum dots (QDs), or to address them optically. The paper reviews different methods of far-field and near-field approach to visualize nano-size objects.

Czech abstract

Rozlišení v konvenční optice je limitováno difrakcí na polovinu vlnové délky. Současné trendy k miniaturizaci optických součástek vyžadují vyšší rozlišení. Z tohoto důvodu je proveden přehled metod využívajících rastrovací mikroskopy v blízkém poli, protože hrot sondy v těsné blízkosti povrchu není omezen difrakcí, nýbrž jen svými rozměry. Proto je možné použít tyto mikroskopy k měření spektrálních a dalších charakteristik předmětů s nanodetaily, např. kvantovými tečkami.

English abstract

Conventional optics is diffraction limited to about half of the effective optical wavelength. However the current trend towards miniaturization of optical elements and devices requires methods of observation with high spatial resolutions adapted to the micrometer and submicrometer optical regime. More specifically, the use of Scanning near-field optical microscope (SNOM or NSOM) in various domains is overviewed. Basically an optical tip with a subwavelength aperture at its apex scans over a surface with a spatial resolution, which is not limited by light diffraction. This characteristic makes SNOM a valuable tool to perform various optical or spectroscopic studies on nanoobjects, such as semiconductor quantum dots (QDs), or to address them optically. The paper reviews different methods of far-field and near-field approach to visualize nano-size objects.

Keywords

nanoobject, visualization, far-field, near-field, scanning near field optical microscopy, contrast, detection, localization, resolution, measurement

RIV year

2008

Released

22.04.2008

Publisher

SPIE

Location

Bellinhgham, USA

ISBN

978-0-8194-7218-2

Book

Proceedings SPIE -Eighth International Conference on Correlation Optics

Edition

7008

Edition number

7008

Pages from

70081F01

Pages to

70081F11

Pages count

11

BibTex


@inproceedings{BUT29321,
  author="Pavel {Tománek} and Lubomír {Grmela}",
  title="Optics of nanoobjects",
  annote="Conventional optics is diffraction limited to about half of the effective optical wavelength. However the current trend towards miniaturization of optical elements and devices requires methods of observation with high spatial resolutions adapted to the micrometer and submicrometer optical regime. More specifically, the use of Scanning near-field optical microscope (SNOM or NSOM) in various domains is overviewed. Basically an optical tip with a subwavelength aperture at its apex scans over a surface with a spatial resolution, which is not limited by light diffraction. This characteristic makes SNOM a valuable tool to perform various optical or spectroscopic studies on nanoobjects, such as semiconductor quantum dots (QDs), or to address them optically. The paper reviews different methods of far-field and near-field approach to visualize nano-size objects.",
  address="SPIE",
  booktitle="Proceedings SPIE -Eighth International Conference on Correlation Optics",
  chapter="29321",
  edition="7008",
  howpublished="print",
  institution="SPIE",
  journal="Proceedings of SPIE",
  number="7008",
  year="2008",
  month="april",
  pages="70081F01--70081F11",
  publisher="SPIE",
  type="conference paper"
}