Publication detail

Reduction of Test Vectors Volume by Means of Gate-Level Reconfiguration

STAREČEK, L. SEKANINA, L. KOTÁSEK, Z.

Original Title

Reduction of Test Vectors Volume by Means of Gate-Level Reconfiguration

Type

article in a collection out of WoS and Scopus

Language

English

Original Abstract

In this paper, a new concept which allows the reduction of test vectors volume is presented. The concept is based on reconfiguration of some gates of circuit under test. Instead of testing the original circuit, a circuit which has the same topology (but some of its gate functions are reconfigured) is actually tested. Two possible implementations of the reconfiguration are investigated. Preliminary experiments indicate that test length can be reduced to approx. 70% of its initial value while the increase in transistors is moderate.

Keywords

digital circuit, test vector, reconfiguration

Authors

STAREČEK, L.; SEKANINA, L.; KOTÁSEK, Z.

RIV year

2008

Released

17. 4. 2008

Publisher

IEEE Computer Society

Location

Bratislava

ISBN

978-1-4244-2276-0

Book

Proc. of 2008 IEEE Design and Diagnostics of Electronic Circuits and Systems Workshop

Pages from

255

Pages to

258

Pages count

4

URL

https://www.fit.vut.cz/research/publication/8603/

BibTex

@inproceedings{BUT27766,
  author="Lukáš {Stareček} and Lukáš {Sekanina} and Zdeněk {Kotásek}",
  title="Reduction of Test Vectors Volume by Means of Gate-Level Reconfiguration",
  booktitle="Proc. of 2008 IEEE Design and Diagnostics of Electronic Circuits and Systems Workshop",
  year="2008",
  pages="255--258",
  publisher="IEEE Computer Society",
  address="Bratislava",
  isbn="978-1-4244-2276-0",
  url="https://www.fit.vut.cz/research/publication/8603/"
}