Publication detail

Scintillation SE Detector for Variable Pressure Microscopes

J. Jirák, J. Linhart and V. Neděla

Original Title

Scintillation SE Detector for Variable Pressure Microscopes

Type

conference paper

Language

English

Original Abstract

This paper deals with secondary electrons detection in the ESEM via the entirely new type of scintillation detector. It is shown a way of using scitillation detector in the condition of elevated pressure conditions.

Keywords

secondary electron, environmental scanning electron microscopy, scintillation detector

Authors

J. Jirák, J. Linhart and V. Neděla

RIV year

2006

Released

22. 5. 2006

Publisher

Institute of Scientific Instruments AS CR and the Czechoslovak Microscopy Society

Location

Brno

ISBN

80-239-6285-X

Book

Recent Trends in Charged Particle Optics and Surface Physics Instrumentation

Pages from

37

Pages to

38

Pages count

2

BibTex

@inproceedings{BUT24371,
  author="Josef {Jirák} and Jan {Linhart} and Vilém {Neděla}",
  title="Scintillation SE Detector for Variable Pressure Microscopes",
  booktitle="Recent Trends in Charged Particle Optics and Surface Physics Instrumentation",
  year="2006",
  volume="10",
  pages="2",
  publisher="Institute of Scientific Instruments AS CR and the Czechoslovak Microscopy Society",
  address="Brno",
  isbn="80-239-6285-X"
}