Publication detail

A Framework for Optimizing a Processor to Selected Application

PODIVÍNSKÝ, J. ČEKAN, O. KRČMA, M. BURGET, R. HRUŠKA, T. KOTÁSEK, Z.

Original Title

A Framework for Optimizing a Processor to Selected Application

Type

conference paper

Language

English

Original Abstract

A processor plays the main role in almost every electronics system. The use of a general purpose processor may not be profitable for a specific application, because the processor is designed for a wide set of applications. Application Specific Instruction-set Processors (ASIPs) are today applied in specific cases, where one application or a certain group of applications is performed. This paper focuses on automatic optimization of an ASIP for a given application through checking its possible configurations of key parameters (number of registers, size of caches, instruction set modification, etc.). The paper also presents designed framework which is able to optimize the given application in terms of speed, area or power consumption. The framework allows to use various optimization methods. For the processor modification, the Codasip Studio tool is used. It allows to generate all tools needed for compilation, simulation, and hardware mapping which are needed in process of ASIP design. The experiments are carried on RISC-V (Reduced Instruction Set Computing) processor described in Codasip Studio.

Keywords

Processor optimization, ASIP, Codasip Studio, embedded system, RISC-V

Authors

PODIVÍNSKÝ, J.; ČEKAN, O.; KRČMA, M.; BURGET, R.; HRUŠKA, T.; KOTÁSEK, Z.

Released

14. 9. 2018

Publisher

IEEE Computer Society

Location

Kazan

ISBN

978-1-5386-5710-2

Book

Proceedings of IEEE East-West Design & Test Symposium

Pages from

564

Pages to

574

Pages count

11

URL

BibTex

@inproceedings{BUT155019,
  author="Jakub {Podivínský} and Ondřej {Čekan} and Martin {Krčma} and Radek {Burget} and Tomáš {Hruška} and Zdeněk {Kotásek}",
  title="A Framework for Optimizing a Processor to Selected Application",
  booktitle="Proceedings of IEEE East-West Design & Test Symposium",
  year="2018",
  pages="564--574",
  publisher="IEEE Computer Society",
  address="Kazan",
  doi="10.1109/EWDTS.2018.8524733",
  isbn="978-1-5386-5710-2",
  url="https://www.fit.vut.cz/research/publication/11689/"
}