Publication detail

Test-chip for non-linear capacitors characterization

Sutorý, T., Kolka, Z.

Original Title

Test-chip for non-linear capacitors characterization

English Title

Test-chip for non-linear capacitors characterization

Type

conference paper

Language

en

Original Abstract

The paper deals with characterization and linearization of non-linear capacitors of MOS transistors. Basic principles of compensation are presented. A test chip for nonlinear capacitance characterization implementing a new measurement method has been developed.

English abstract

The paper deals with characterization and linearization of non-linear capacitors of MOS transistors. Basic principles of compensation are presented. A test chip for nonlinear capacitance characterization implementing a new measurement method has been developed.

Keywords

MOS capacitors, characterization, test-chip, linearization, non-linear

RIV year

2005

Released

01.01.2005

Publisher

Ing. Zdeněk Novotný CSc., Ondráčkova 105, Brno

Location

Brno

ISBN

80-214-2990-9

Book

EDS '05 IMAPS CS International Conference Proceedings

Edition number

první

Pages from

396

Pages to

401

Pages count

6

BibTex


@inproceedings{BUT15128,
  author="Tomáš {Sutorý} and Zdeněk {Kolka}",
  title="Test-chip for non-linear capacitors characterization",
  annote="The paper deals with characterization and linearization of non-linear capacitors of MOS
transistors. Basic principles of compensation are presented. A test chip for nonlinear
capacitance characterization implementing a new measurement method has been developed.",
  address="Ing. Zdeněk Novotný CSc., Ondráčkova 105, Brno",
  booktitle="EDS '05 IMAPS CS International Conference Proceedings",
  chapter="15128",
  institution="Ing. Zdeněk Novotný CSc., Ondráčkova 105, Brno",
  year="2005",
  month="january",
  pages="396",
  publisher="Ing. Zdeněk Novotný CSc., Ondráčkova 105, Brno",
  type="conference paper"
}