Publication detail

THICKNESS DETERMINATION OF CORROSION LAYERS ON Fe USING XPS DEPTH PROFILING

KALINA, L. BÍLEK, V. BUŠO, M. KOPLÍK, J. MÁSILKO, J.

Original Title

THICKNESS DETERMINATION OF CORROSION LAYERS ON Fe USING XPS DEPTH PROFILING

English Title

THICKNESS DETERMINATION OF CORROSION LAYERS ON Fe USING XPS DEPTH PROFILING

Type

journal article in Web of Science

Language

en

Original Abstract

The study deals with the methodology and thickness determination of the corrosion layers of ferritic steel samples using X-ray photoelectron spectroscopy (XPS) equipped with the ion-gun source system enabling destructive depth profiling. It is well known that XPS is one of the most often used techniques for determining both the thickness and chemical composition of passive films or corrosive layers. Unfortunately, the thickness of ion-gun-etched layers can only be estimated for simple samples and standards. Corrosion layers are heterogeneous and vary in composition; therefore, the etching rate is specific for each corrosion layer. The results of this work provide the possibility for a fast and easy determination of the ion-gun sputtering effect with exact settings for multi-compound chemical structures. The knowledge related to the thickness of corrosion or passivation layers would help greatly in their characterization

English abstract

The study deals with the methodology and thickness determination of the corrosion layers of ferritic steel samples using X-ray photoelectron spectroscopy (XPS) equipped with the ion-gun source system enabling destructive depth profiling. It is well known that XPS is one of the most often used techniques for determining both the thickness and chemical composition of passive films or corrosive layers. Unfortunately, the thickness of ion-gun-etched layers can only be estimated for simple samples and standards. Corrosion layers are heterogeneous and vary in composition; therefore, the etching rate is specific for each corrosion layer. The results of this work provide the possibility for a fast and easy determination of the ion-gun sputtering effect with exact settings for multi-compound chemical structures. The knowledge related to the thickness of corrosion or passivation layers would help greatly in their characterization

Keywords

X-ray photo-electron spectroscopy, ion gun, depth profiling, corrosion layer

Released

01.10.2018

ISBN

1580-2949

Periodical

Materiali in tehnologije

Year of study

52

Number

5

State

SI

Pages from

537

Pages to

540

Pages count

4

Documents

BibTex


@article{BUT150421,
  author="Lukáš {Kalina} and Vlastimil {Bílek} and Marek {Bušo} and Jan {Koplík} and Jiří {Másilko}",
  title="THICKNESS DETERMINATION OF CORROSION LAYERS ON Fe USING XPS DEPTH PROFILING",
  annote="The study deals with the methodology and thickness determination of the corrosion layers of ferritic steel samples using X-ray photoelectron spectroscopy (XPS) equipped with the ion-gun source system enabling destructive depth profiling. It is well known that XPS is one of the most often used techniques for determining both the thickness and chemical composition of passive films or corrosive layers. Unfortunately, the thickness of ion-gun-etched layers can only be estimated for simple samples and standards. Corrosion layers are heterogeneous and vary in composition; therefore, the etching rate is specific for each corrosion layer. The results of this work provide the possibility for a fast and easy determination of the ion-gun sputtering effect
with exact settings for multi-compound chemical structures. The knowledge related to the thickness of corrosion or passivation layers would help greatly in their characterization",
  chapter="150421",
  doi="10.17222/mit.2016.180",
  howpublished="print",
  number="5",
  volume="52",
  year="2018",
  month="october",
  pages="537--540",
  type="journal article in Web of Science"
}