Publication detail

Ultra-short solitary electromagnetic pulses measurement and semiconductor testing

FIALA, P. GESCHEIDTOVÁ, E. STEINBAUER, M.

Original Title

Ultra-short solitary electromagnetic pulses measurement and semiconductor testing

Type

conference paper

Language

English

Original Abstract

In connection with the events of the last few years and with the increased number of terrorist activities, the problem of identification and measurement of electromagnetic weapons or other systems impact occurred. Among these are also microwave sources, which can reach extensive peak power of up to Pmax = 100 MW. Solitary, in some cases several times repeated, impulses lasting from tp = <1, 60> ns, cause the destruction of semiconductor junctions. These days we can find scarcely no human activity, where semiconductor structures are not used. The problem of security support of the air traffic, transportation, computer nets, banks, national strategic data centers, and other applications crops up. Several types of system protection from the ultra-short electromagnetic pulses present itself, passive and active protection. The analysis of the possible measuring methods, convenient for the identification and measurement of the ultra-short solitary electromagnetic pulses is presented in this paper; some of the methods were chosen and used for practical measurement.

Keywords

Measurement, weapons, electromagnetic puls, high power microwave source, calorimetric method, electro-optic method

Authors

FIALA, P.; GESCHEIDTOVÁ, E.; STEINBAUER, M.

RIV year

2004

Released

26. 5. 2004

Location

Polsko

ISBN

83-85940-26-X

Book

IC-SPETO 2004

Edition

Vol.1

Edition number

první

Pages from

159

Pages to

320

Pages count

162

BibTex

@inproceedings{BUT14251,
  author="Pavel {Fiala} and Eva {Gescheidtová} and Miloslav {Steinbauer}",
  title="Ultra-short solitary electromagnetic pulses measurement and semiconductor testing",
  booktitle="IC-SPETO 2004",
  year="2004",
  series="Vol.1",
  number="první",
  pages="162",
  address="Polsko",
  isbn="83-85940-26-X"
}