Publication detail

A numerical characterization of nanoparticle distribution on surface of a semiconductor

RUDOLFOVÁ, Z. HODEROVÁ, J.

Original Title

A numerical characterization of nanoparticle distribution on surface of a semiconductor

English Title

A numerical characterization of nanoparticle distribution on surface of a semiconductor

Type

journal article in Scopus

Language

en

Original Abstract

The motivation for this work was to qualitatively describe the distribution of Au nanoparticles on the surface of a semiconductor. We discuss suitable mathematical characteristics which allow the uniform distribution to be distinguished from the distribution affected by any physical phenomenon, i.e. by the repulsive force between electrically charged particles or by the influence of properties of the surface. We identify Voronoi decomposition and a statistical analysis of Voronoi cell properties as a suitable tool for this purpose.

English abstract

The motivation for this work was to qualitatively describe the distribution of Au nanoparticles on the surface of a semiconductor. We discuss suitable mathematical characteristics which allow the uniform distribution to be distinguished from the distribution affected by any physical phenomenon, i.e. by the repulsive force between electrically charged particles or by the influence of properties of the surface. We identify Voronoi decomposition and a statistical analysis of Voronoi cell properties as a suitable tool for this purpose.

Keywords

distribution, Voronoi diagram, hypothesis testing, Legendre ellipse, 4PL function, nanoparticles

Released

19.06.2017

Location

Brno

ISBN

1803-3814

Book

Mendel Journal series

Pages from

125

Pages to

132

Pages count

8

Documents

BibTex


@article{BUT141565,
  author="Zdena {Rudolfová} and Jana {Hoderová}",
  title="A numerical characterization of nanoparticle distribution on surface of a semiconductor",
  annote="The motivation for this work was to qualitatively describe the distribution of Au nanoparticles on the surface of a semiconductor. We discuss suitable mathematical characteristics which allow the uniform distribution to be distinguished from the distribution affected by any physical phenomenon, i.e. by the repulsive force between electrically charged particles or by the influence of properties of the surface.  We identify Voronoi decomposition and a statistical analysis of Voronoi cell properties as a suitable tool for this purpose.",
  booktitle="Mendel Journal series",
  chapter="141565",
  howpublished="print",
  number="1",
  volume="23",
  year="2017",
  month="june",
  pages="125--132",
  type="journal article in Scopus"
}