Publication detail

Wireless device classification through transmitter imperfections — Evaluation of performance degradation due to the chip heating

POSPÍŠIL, M. MARŠÁLEK, R. GÖTTHANS, T.

Original Title

Wireless device classification through transmitter imperfections — Evaluation of performance degradation due to the chip heating

Type

conference paper

Language

English

Original Abstract

The wireless devices classification based on the transmitter imperfections is one of the promising ways to provide additional security to future wireless communication networks. Although several aspects, both theoretical and practical, have been studied recently, there are no studies investigating the degradation of such authentication due to the environmental changes, such as the device temperature. We present the initial results of measurements of Fclassification method based on the Gaussian mixture model classifier under the influence of temperature variations. With the use of the widely used USRP devices, we also try to estimate which of the RF impairments is sensitive to such changes.

Keywords

RF imperfections; physical layer security; IQ imbalances; USRP

Authors

POSPÍŠIL, M.; MARŠÁLEK, R.; GÖTTHANS, T.

Released

15. 1. 2017

ISBN

978-1-5090-3446-8

Book

Proceedings of IEEE Radio and Wireless Symposium (RWS), 2017

Pages from

169

Pages to

172

Pages count

4

BibTex

@inproceedings{BUT141203,
  author="Martin {Pospíšil} and Roman {Maršálek} and Tomáš {Götthans}",
  title="Wireless device classification through transmitter imperfections — Evaluation of performance degradation due to the chip heating",
  booktitle="Proceedings of  IEEE Radio and Wireless Symposium (RWS), 2017",
  year="2017",
  pages="169--172",
  doi="10.1109/RWS.2017.7885978",
  isbn="978-1-5090-3446-8"
}