Publication detail

Measurement and Evaluation of IQ-Imbalances in DVB-T and DVB-T2-Lite OFDM Modulators

POLÁK, L. KRATOCHVÍL, T.

Original Title

Measurement and Evaluation of IQ-Imbalances in DVB-T and DVB-T2-Lite OFDM Modulators

Type

conference paper

Language

English

Original Abstract

First and second generation digital video broadcasting terrestrial systems (DVB-T and DVB-T2/T2-Lite), like many other wireless communication standards, contain an Orthogonal Frequency Division Multiplexing (OFDM) signal processing chain. One of the main disadvantages of the OFDM technique is its high sensitivity to the non-orthogonality between In-Phase and Quadrature (IQ) signals in the IQ modulator/demodulator. This article focuses on exploration of the DVB-T and DVB-T2-Lite performance degradation caused by various IQ-errors. Portable transmission scenarios are considered and modeled by Portable Indoor and Outdoor (PI3 and PO3) fading channels. Objective system parameters, namely bit and modulation error ratio (BER and MER), are used to compare overall DVB-T and DVB-T2-Lite performances. Results show higher resistance of DVB-T2-Lite against IQ-errors whereas, lower amount of such errors causes similar performance degradation in both systems.

Keywords

DVB-T, DVB-T2-Lite, amplitude imbalance, phase imbalance, BER, MER, QEF, iteration number, fading channel

Authors

POLÁK, L.; KRATOCHVÍL, T.

Released

5. 7. 2017

ISBN

978-1-5090-3981-4

Book

Proceeding of 40th International Conference on Telecommunications and Signal Processing (TSP)

Pages from

555

Pages to

558

Pages count

4

URL

http://ieeexplore.ieee.org/document/8076048/

BibTex

@inproceedings{BUT137682,
  author="Ladislav {Polák} and Tomáš {Kratochvíl}",
  title="Measurement and Evaluation of IQ-Imbalances in DVB-T and DVB-T2-Lite OFDM Modulators",
  booktitle="Proceeding of 40th International Conference on Telecommunications and Signal Processing (TSP)",
  year="2017",
  pages="555--558",
  doi="10.1109/TSP.2017.8076048",
  isbn="978-1-5090-3981-4",
  url="http://ieeexplore.ieee.org/document/8076048/"
}