Publication detail

Practically Implemented Electronically Controlled CMOS Voltage Differencing Current Conveyor

ŠOTNER, R. JEŘÁBEK, J. PROKOP, R. KLEDROWETZ, V. POLÁK, J. FUJCIK, L. DOSTÁL, T.

Original Title

Practically Implemented Electronically Controlled CMOS Voltage Differencing Current Conveyor

Czech Title

Prakticky implementovaný elektronicky řiditelný CMOS proudový konvejor s napěťovou diferencí

English Title

Practically Implemented Electronically Controlled CMOS Voltage Differencing Current Conveyor

Type

conference paper

Language

en

Original Abstract

This paper presents electronically controllable concept of the CMOS voltage differencing current conveyor (VDCC) for precise operations with large dynamic range and for robust automotive applications. It was designed and fabricated in ON Semiconductor 0.7 um I2T100 technology. Because of unique internal structure, not only value but also polarity of transconductance stage of VDCC can be controlled electronically by external DC voltage. Moreover, adjusting of resistance of current input terminal is possible by DC bias current. This contribution includes also the most important characteristics of manufactured chip obtained by laboratory measurement of prototype sample and obtained controllability ranges are compared with Cadence Spectre simulations.

Czech abstract

Článek prezentuje elektronicky řiditelný koncept CMOS proudového konvejoru s napěťovou diferencí (tzv. VDCC) pro precisní operace s velkým dynamickým rozsahem a pro robustní aplikace. Byl navržen a vyroben v technologii On Semiconductor 0.7 um I2T100. Díky unikátní interní struktuře lze měnit nejen hodnotu ale i polaritu transkonduktance vstupní sekce řízenou externím DC napětím. Kromě toho je možná i kontrola odporu vstupního terminálu proudu DC biasovacím proudem. Příspěvek obsahuje nejdůležitější charakteristiky vyrobeného čipu získané z lab. měření prototypu a dosažené rozsahy ovládání parametrů jsou porovnány se simulacemi v Cadence Spectre.

English abstract

This paper presents electronically controllable concept of the CMOS voltage differencing current conveyor (VDCC) for precise operations with large dynamic range and for robust automotive applications. It was designed and fabricated in ON Semiconductor 0.7 um I2T100 technology. Because of unique internal structure, not only value but also polarity of transconductance stage of VDCC can be controlled electronically by external DC voltage. Moreover, adjusting of resistance of current input terminal is possible by DC bias current. This contribution includes also the most important characteristics of manufactured chip obtained by laboratory measurement of prototype sample and obtained controllability ranges are compared with Cadence Spectre simulations.

Keywords

Electronic control, voltage differencing current conveyor, VDCC, transconductance control, input resistance control, CMOS implementation, ON Semiconductor 0.7 um I2T100

Released

16.10.2016

Publisher

Khalifa University, UAE

Location

UAE, Abu Dhabi

ISBN

978-1-5090-0916-9

Book

Proceedings of 2016 IEEE 59th International Midwest Symposium on Circuits and Systems (MWSCAS)

Pages from

667

Pages to

670

Pages count

4

BibTex


@inproceedings{BUT129120,
  author="Roman {Šotner} and Jan {Jeřábek} and Roman {Prokop} and Vilém {Kledrowetz} and Josef {Polák} and Lukáš {Fujcik} and Tomáš {Dostál}",
  title="Practically Implemented Electronically Controlled CMOS Voltage Differencing Current Conveyor",
  annote="This paper presents electronically controllable concept of the CMOS voltage differencing current conveyor (VDCC) for precise operations with large dynamic range and for robust automotive applications. It was designed and fabricated in ON Semiconductor 0.7 um I2T100 technology. Because of unique internal structure, not only value but also polarity of transconductance stage of VDCC can be controlled electronically by external DC voltage. Moreover, adjusting of resistance of current input terminal is possible by DC bias current. This contribution includes also the most important characteristics of manufactured chip obtained by laboratory measurement of prototype sample and obtained controllability ranges are compared with Cadence Spectre simulations.",
  address="Khalifa University, UAE",
  booktitle="Proceedings of 2016 IEEE 59th International Midwest Symposium on Circuits and Systems (MWSCAS)",
  chapter="129120",
  howpublished="online",
  institution="Khalifa University, UAE",
  year="2016",
  month="october",
  pages="667--670",
  publisher="Khalifa University, UAE",
  type="conference paper"
}