Publication detail

Low-Frequency Noise Diagnostic of Silicon Concentrator Photovoltaic Cell With Very High Efficiency

VANĚK, J. CHOBOLA, Z. LUŇÁK, M.

Original Title

Low-Frequency Noise Diagnostic of Silicon Concentrator Photovoltaic Cell With Very High Efficiency

Type

conference paper

Language

English

Original Abstract

This paper deals with comparisons of noise spectroscopy, I-V characteristic and microplasma detection of silicon concentrator photovoltaic (CPV) cell with very high efficiency. Efficiency reaches to 38%. We studied two groups with different technologies (A and B). Each group had 6 samples. The samples were quality screened using noise analysis. From the measurement results it follows that the noise spectral density related to defects is of 1/f or generation-recombination types. G-R noise and burst noise is not fundamental noise and therefore can by use as a quality indicator.

Keywords

photovoltaic cell, concentrator, noise spectroscopy, microplasma

Authors

VANĚK, J.; CHOBOLA, Z.; LUŇÁK, M.

RIV year

2015

Released

10. 12. 2015

Publisher

ECS Transaction

Location

USA

ISBN

978-80-214-5109-4

Book

ECS Trans. 2015 70(1)

ISBN

1938-5862

Periodical

ECS Transactions

Year of study

70

Number

1

State

United States of America

Pages from

245

Pages to

253

Pages count

8

BibTex

@inproceedings{BUT120033,
  author="Jiří {Vaněk} and Zdeněk {Chobola} and Miroslav {Luňák}",
  title="Low-Frequency Noise Diagnostic of Silicon Concentrator Photovoltaic Cell With
Very High Efficiency",
  booktitle="ECS Trans. 2015 70(1)",
  year="2015",
  journal="ECS Transactions",
  volume="70",
  number="1",
  pages="245--253",
  publisher="ECS Transaction",
  address="USA",
  doi="10.1149/07001.0245ecst",
  isbn="978-80-214-5109-4",
  issn="1938-5862"
}