Publication detail

Local characterization of optical waveguide structure using Scanning near-field optical microscopy

OTEVŘELOVÁ, D. TOMÁNEK, P. GRMELA, L.

Original Title

Local characterization of optical waveguide structure using Scanning near-field optical microscopy

Czech Title

Lokální charakterizace struktur optických vlnovodů pomocí rastrovací optické mikroskopie v blízkém poli

English Title

Local characterization of optical waveguide structure using Scanning near-field optical microscopy

Type

conference paper

Language

en

Original Abstract

Scanning near-field optical microscopy (SNOM) has been used to measure the internal spatial modes and local properties controlling optical wave propagation in glass/silica buried waveguides. The period of the observed standing modes provides a direct measure of the effective index, which combined with the measured transverse modal shape and decay constants, determines the values of all spatial components of the wave vector. Typically, small fluctuations in the material properties of structures can prevent proper operation as well as accurate diagnostic device modeling. The SNOM local probe measurements provide a means of detailed characterization, and defects in processing and their affects on performance are readily identified. We have also developed a technique that can obtain information about the locations of remote dielectric interfaces based upon the rate of change in the phase of the standing wave as a function of wavelength. Finally, experimental results addressing the issue of perturbation of the SNOM probe on the measurement of the local field shows a weak but measurable perturbation, and the dependence on aperture and material parameters will be discussed.

Czech abstract

Rastrovací optická mikroskopie v blízkém poli(SNOM) je možné použít k měření vnitřního rozložení vidů a lokálních vlastností vlnovodu. Malé fluktuace charakteristik materiálu mohou ovlivnit vlastní měření. Lokální sondové měření umožní vyhnout se tomuto problému a experimentálně ověřit perturbace zavedené při měření pomocí sondy SNOM.

English abstract

Scanning near-field optical microscopy (SNOM) has been used to measure the internal spatial modes and local properties controlling optical wave propagation in glass/silica buried waveguides. The period of the observed standing modes provides a direct measure of the effective index, which combined with the measured transverse modal shape and decay constants, determines the values of all spatial components of the wave vector. Typically, small fluctuations in the material properties of structures can prevent proper operation as well as accurate diagnostic device modeling. The SNOM local probe measurements provide a means of detailed characterization, and defects in processing and their affects on performance are readily identified. We have also developed a technique that can obtain information about the locations of remote dielectric interfaces based upon the rate of change in the phase of the standing wave as a function of wavelength. Finally, experimental results addressing the issue of perturbation of the SNOM probe on the measurement of the local field shows a weak but measurable perturbation, and the dependence on aperture and material parameters will be discussed.

Keywords

waveguide, optical properties, local probe measurement

RIV year

2004

Released

16.06.2004

Publisher

Slovak Technical University in Bratislava

Location

Bratislava

ISBN

80-227-2073-9

Book

Applied physics on condensed matter APCOM – 2004

Pages from

183

Pages to

186

Pages count

4

BibTex


@inproceedings{BUT10972,
  author="Dana {Otevřelová} and Pavel {Tománek} and Lubomír {Grmela}",
  title="Local characterization of optical waveguide structure using Scanning near-field optical microscopy",
  annote="Scanning near-field optical microscopy (SNOM) has been used to measure the internal spatial
modes and local properties controlling optical wave propagation in glass/silica buried
waveguides. The period of the observed standing modes provides a direct measure of the
effective index, which combined with the measured transverse modal shape and decay constants,
determines the values of all spatial components of the wave vector.
Typically, small fluctuations in the material properties of structures can prevent proper
operation as well as accurate diagnostic device modeling. The SNOM local probe measurements
provide a means of detailed characterization, and defects in processing and their affects on
performance are readily identified. We have also developed a technique that can obtain
information about the locations of remote dielectric interfaces based upon the rate of change in
the phase of the standing wave as a function of wavelength. Finally, experimental results
addressing the issue of perturbation of the SNOM probe on the measurement of the local field
shows a weak but measurable perturbation, and the dependence on aperture and material
parameters will be discussed.
",
  address="Slovak Technical University in Bratislava",
  booktitle="Applied physics on condensed matter APCOM – 2004",
  chapter="10972",
  institution="Slovak Technical University in Bratislava",
  year="2004",
  month="june",
  pages="183--186",
  publisher="Slovak Technical University in Bratislava",
  type="conference paper"
}