Publication detail

Progression of Silicon Solar Cells Luminescence Diagnostic Methods

STOJAN, R. VANĚK, J. MALÝ, M.

Original Title

Progression of Silicon Solar Cells Luminescence Diagnostic Methods

Type

journal article - other

Language

English

Original Abstract

Diagnostic of silicon solar cells defects is permanently one of most important steps in production of solar cells. Specify of diagnostic methods leads to a better understanding and more detailed analysis of manufactured cells. Luminescence methods of solar cells are fast and some of the most common methods today. According to the excitation method of luminescence radiation from silicon solar cells we talk about electroluminescence or photoluminescence methods. Spectral response of using CCD camera with those methods is in band-gap infrared wave length area. The main idea of this paper is to analyze emitted infrared radiation silicon solar cell under the forward bias by polarization spectroscopy. This analysis opens up for potential next new questions in diagnostics defects silicon solar cells by luminescence methods.

Keywords

Silicon defect, luminescence, defect detection.

Authors

STOJAN, R.; VANĚK, J.; MALÝ, M.

RIV year

2014

Released

1. 1. 2014

Publisher

Horizon Research Publishing,USA

Location

USA

ISBN

2332-3299

Periodical

Universal Journal of Electrical and Electronic Engineering

Year of study

2

Number

1

State

United States of America

Pages from

18

Pages to

22

Pages count

5

URL

http://www.hrpub.org/journals/jour_info.php?id=49

BibTex

@article{BUT103820,
  author="Radek {Stojan} and Jiří {Vaněk} and Martin {Malý}",
  title="Progression of Silicon Solar Cells Luminescence Diagnostic Methods",
  journal="Universal Journal of Electrical and Electronic Engineering",
  year="2014",
  volume="2",
  number="1",
  pages="18--22",
  doi="10.13189/ujeee.2014.020103",
  issn="2332-3299",
  url="http://www.hrpub.org/journals/jour_info.php?id=49"
}