Publication detail

Noise sources in interface between mono-crystalline and amorphous semiconductors

PAVELKA, J. ŠIKULA, J. TACANO, M. CHVÁTAL, M. DALLAEVA, D. GRMELA, L.

Original Title

Noise sources in interface between mono-crystalline and amorphous semiconductors

Czech Title

Zdroje šumu na rozhraní mezi monokrystalickými a amorfními polovodiči

English Title

Noise sources in interface between mono-crystalline and amorphous semiconductors

Type

conference paper

Language

en

Original Abstract

RTS noise in Si/SiO2, InGaAs/InAlAs and GaN/AlGaN structures was analysed and several important trap parameters, such as cross-section, activation energy and position in the channel could be estimated.

Czech abstract

Na základě analýzy RTS šumu ve strukturách Si/SiO2, InGaAs/InAlAs a GaN/AlGaN byly stanoveny parametry pastí na rozhraní, jako jejich aktivní průřez, aktivační energie a poloha v kanálu.

English abstract

RTS noise in Si/SiO2, InGaAs/InAlAs and GaN/AlGaN structures was analysed and several important trap parameters, such as cross-section, activation energy and position in the channel could be estimated.

Keywords

RTS noise, trap, GaN, InGaAs

RIV year

2013

Released

25.11.2013

Publisher

Comenius University

Location

Bratislava

ISBN

978-80-223-3501-0

Book

Proceedings of 8th solid state surfaces and interfaces

Pages from

128

Pages to

129

Pages count

2

BibTex


@inproceedings{BUT103237,
  author="Jan {Pavelka} and Josef {Šikula} and Munecazu {Tacano} and Miloš {Chvátal} and Dinara {Sobola} and Lubomír {Grmela}",
  title="Noise sources in interface between mono-crystalline and amorphous semiconductors",
  annote="RTS noise in Si/SiO2, InGaAs/InAlAs and GaN/AlGaN structures was analysed and several important trap parameters, such as cross-section, activation energy and position in the channel could be estimated.",
  address="Comenius University",
  booktitle="Proceedings of 8th solid state surfaces and interfaces",
  chapter="103237",
  howpublished="print",
  institution="Comenius University",
  year="2013",
  month="november",
  pages="128--129",
  publisher="Comenius University",
  type="conference paper"
}