Publication detail

Luminescence radiation spectroscopy of silicon solar cells

STOJAN, R. VANĚK, J. MALÝ, M. GVRITISHVILI, R. TOMÁNEK, P. FRANTÍK, O.

Original Title

Luminescence radiation spectroscopy of silicon solar cells

Type

journal article - other

Language

English

Original Abstract

This paper deals about results of new potential in to use one of characteristics luminescence radiation for detection defects of solar cells. So polarization spectroscopy of defect in solar cells may be used to fitting characterization of silicon solar cells. Radiation emitted by the solar cell has a wave character that can interact with the silicon structures or hypothetically thin reflectance layer of solar cells. In our research we can observed the linear partially polarization luminescence light on poly-silicon crack defect. Spectral response of using CCD camera is approximately 300 to 1100 nm. Sinusoid dependence of luminescence intensity on the angle of linear polarization analyzer rotation shown this fact. The degree of polarization depends on the material, in this case the character of defect. Polarized light can be obtained in various ways. This fact opens up for potential next new questions in this widely course of study diagnostics defects silicon solar cells.

Keywords

Solar cells, photoluminescence, electroluminescence, electromagnetic radiation, polarization, defect.

Authors

STOJAN, R.; VANĚK, J.; MALÝ, M.; GVRITISHVILI, R.; TOMÁNEK, P.; FRANTÍK, O.

RIV year

2013

Released

27. 9. 2013

Publisher

SPIE

Location

Bellingham USA

ISBN

0277-786X

Periodical

Proceedings of SPIE

Year of study

8825

Number

8825

State

United States of America

Pages from

882529

Pages to

882535

Pages count

6

BibTex

@article{BUT101917,
  author="Radek {Stojan} and Jiří {Vaněk} and Martin {Malý} and Roman {Gvritishvili} and Pavel {Tománek} and Ondřej {Frantík}",
  title="Luminescence radiation spectroscopy of silicon solar cells",
  journal="Proceedings of SPIE",
  year="2013",
  volume="8825",
  number="8825",
  pages="882529--882535",
  doi="10.1117/12.2024290",
  issn="0277-786X"
}