Publication detail

Analysis of luminescence radiation interact by silicon defects

STOJAN, R. VANĚK, J. MALÝ, M. GVRITISHVILI, R. ŠIMONOVÁ, L. FRANTÍK, O.

Original Title

Analysis of luminescence radiation interact by silicon defects

Type

conference paper

Language

English

Original Abstract

Luminescence diagnostic methods of solar cells have still significant diagnostic potential. According to the excitation method of luminescence radiation from silicon solar cells we talk about electroluminescence or photoluminescence methods. Polarization spectroscopy of defects in solar cells may be used to better characterization of solar cells. We used the existing electroluminescence technology and extend it about known polarization spectroscopy to yield the polarized luminescence light by defect in solar cells structure (in wavelengths area with peak about 1100 nm).

Keywords

Solar cell, silicon defect, polarization, luminescence.

Authors

STOJAN, R.; VANĚK, J.; MALÝ, M.; GVRITISHVILI, R.; ŠIMONOVÁ, L.; FRANTÍK, O.

RIV year

2013

Released

3. 9. 2013

Publisher

VUT v Brně

Location

Brno

ISBN

978-80-214-4767-7

Book

Advanced Batteries, Accumulators and Fuel Cells [ABAF 14th]

Edition

1

Edition number

1

Pages from

124

Pages to

126

Pages count

3

BibTex

@inproceedings{BUT101533,
  author="Radek {Stojan} and Jiří {Vaněk} and Martin {Malý} and Roman {Gvritishvili} and Lucie {Šimonová} and Ondřej {Frantík}",
  title="Analysis of luminescence radiation interact by silicon defects",
  booktitle="Advanced Batteries, Accumulators and Fuel Cells [ABAF 14th]",
  year="2013",
  series="1",
  number="1",
  pages="124--126",
  publisher="VUT v Brně",
  address="Brno",
  isbn="978-80-214-4767-7"
}