Publication detail

Microscopic optoelectronic defectoscopy of solar cells

ŠKARVADA, P. TOMÁNEK, P. KOKTAVÝ, P. DALLAEVA, D.

Original Title

Microscopic optoelectronic defectoscopy of solar cells

Type

journal article - other

Language

English

Original Abstract

Scanning probe microscopes are powerful tool for micro- or nanoscale diagnostics of defects in crystalline silicon solar cells. Solar cell is a large p-n junction semiconductor device. Its quality is strongly damaged by the presence of defects. If the cell works under low reverse-biased voltage, defects emit a light in visible range. The suggested method combines three different measurements: electric noise measurement, local topography and near-field optical beam induced current and thus provides more complex information. To prove its feasibility, we have selected one defect (truncated pyramid) in the sample, which emitted light under low reverse-biased voltage.

Keywords

solar cell, defect, noise, topography, induced photocurrent

Authors

ŠKARVADA, P.; TOMÁNEK, P.; KOKTAVÝ, P.; DALLAEVA, D.

RIV year

2013

Released

3. 5. 2013

Publisher

EDP Sciences

Location

Les Ullis, Francie

ISBN

2100-014X

Periodical

EPJ Web of Conferences

Year of study

48

Number

1

State

French Republic

Pages from

1

Pages to

4

Pages count

4

URL

https://www.epj-conferences.org/articles/epjconf/abs/2013/09/epjconf_OAM2012_00026/epjconf_OAM2012_00026.html

Full text in the Digital Library

http://hdl.handle.net/11012/193661

BibTex

@article{BUT99870,
  author="Pavel {Škarvada} and Pavel {Tománek} and Pavel {Koktavý} and Dinara {Sobola}",
  title="Microscopic optoelectronic defectoscopy of solar cells",
  journal="EPJ Web of Conferences",
  year="2013",
  volume="48",
  number="1",
  pages="1--4",
  doi="10.1051/epjconf/20134800026",
  issn="2100-014X",
  url="https://www.epj-conferences.org/articles/epjconf/abs/2013/09/epjconf_OAM2012_00026/epjconf_OAM2012_00026.html"
}