Publication detail

Near electromagnetic field measurement of microprocessor

MARTINÁSEK, Z. ZEMAN, V. SYSEL, P. TRÁSY, K.

Original Title

Near electromagnetic field measurement of microprocessor

English Title

Near electromagnetic field measurement of microprocessor

Type

journal article - other

Language

en

Original Abstract

The article describe systematically the electromagnetic (EM) side channels sources and electromagnetic field of the microprocessor and is focused on the best way how to measure the near electromagnetic field of microprocessor. It was suggested and realized several electromagnetic probes and it was performed the measurement regarded to the theoretical background on the testbed with cryptographic module (microprocessor) performed the Advanced Encryption Standard (AES). On the measured waveforms of the electromagnetic emission was studied the influence of probe construction namely two parameters wire diameter and number of turns. In following measurement was studied how induced voltage depending on the distance of measuring coil to microprocessor and the last measurement dealt with position of probe and microchip.

English abstract

The article describe systematically the electromagnetic (EM) side channels sources and electromagnetic field of the microprocessor and is focused on the best way how to measure the near electromagnetic field of microprocessor. It was suggested and realized several electromagnetic probes and it was performed the measurement regarded to the theoretical background on the testbed with cryptographic module (microprocessor) performed the Advanced Encryption Standard (AES). On the measured waveforms of the electromagnetic emission was studied the influence of probe construction namely two parameters wire diameter and number of turns. In following measurement was studied how induced voltage depending on the distance of measuring coil to microprocessor and the last measurement dealt with position of probe and microchip.

Keywords

elektromagnetic analysis, EMA, side channel, electromagnetic field of microprocessor.

RIV year

2013

Released

08.02.2013

Pages from

203

Pages to

207

Pages count

5

BibTex


@article{BUT97831,
  author="Zdeněk {Martinásek} and Václav {Zeman} and Petr {Sysel} and Krisztina {Trásy}",
  title="Near electromagnetic field measurement of microprocessor",
  annote="The article describe systematically the electromagnetic (EM) side channels sources and electromagnetic field of the microprocessor and is focused on the best way how to measure the near electromagnetic field of microprocessor.
It was suggested and realized several electromagnetic probes and it was performed the measurement regarded to the theoretical background on the testbed with cryptographic module (microprocessor)  performed the Advanced Encryption Standard (AES).
On the measured waveforms of the electromagnetic emission was studied the influence of probe construction namely two parameters wire diameter and number of turns.
In following measurement was studied how induced voltage depending on the distance of measuring coil to microprocessor and the last measurement dealt with position of probe and microchip.",
  chapter="97831",
  number="02",
  volume="2013",
  year="2013",
  month="february",
  pages="203--207",
  type="journal article - other"
}