Publication detail

Statistical Analysis of Blind-Oversampling CDR Circuits

KOLKA, Z. KUBÍČEK, M. BIOLKOVÁ, V. BIOLEK, D.

Original Title

Statistical Analysis of Blind-Oversampling CDR Circuits

English Title

Statistical Analysis of Blind-Oversampling CDR Circuits

Type

conference paper

Language

en

Original Abstract

The paper deals with two statistical simulation models for feed-forward blind-oversampling Clock and Data Recovery circuits, which determine the center of the data eye by observing the positions of edges in a data stream. The first model describes the traditional averaged phase picking method based on counting the edges in several domains, which divide the signal period. The second model was developed for a newly proposed CDR circuit, which selects the optimum sampling phase upon the occurrence of several consecutive edges in one sampling domain. Its simulation model is based on the periodic Markov chain representation of the domain-selection process. The averaged Bit-Error Rate can be simply computed from the steady-state of the chain. The computational complexity of statistical models is determined by the added jitter properties rather than by the actual level of bit-error rate. The models include random jitter, sinusoidal jitter, and frequency offset of transmit and receive clocks.

English abstract

The paper deals with two statistical simulation models for feed-forward blind-oversampling Clock and Data Recovery circuits, which determine the center of the data eye by observing the positions of edges in a data stream. The first model describes the traditional averaged phase picking method based on counting the edges in several domains, which divide the signal period. The second model was developed for a newly proposed CDR circuit, which selects the optimum sampling phase upon the occurrence of several consecutive edges in one sampling domain. Its simulation model is based on the periodic Markov chain representation of the domain-selection process. The averaged Bit-Error Rate can be simply computed from the steady-state of the chain. The computational complexity of statistical models is determined by the added jitter properties rather than by the actual level of bit-error rate. The models include random jitter, sinusoidal jitter, and frequency offset of transmit and receive clocks.

Keywords

blind oversampling CDR; jitter tolerance; statistical methods;

RIV year

2012

Released

03.10.2012

Publisher

IEEE

Location

Saint Petersburg, Russia

ISBN

978-1-4673-2015-3

Book

Proceedings of Int. Congress on Ultra Modern Telecommunications and Control Systems (ICUMT 2012)

Pages from

497

Pages to

501

Pages count

5

Documents

BibTex


@inproceedings{BUT94905,
  author="Zdeněk {Kolka} and Michal {Kubíček} and Viera {Biolková} and Dalibor {Biolek}",
  title="Statistical Analysis of Blind-Oversampling CDR Circuits",
  annote="The paper deals with two statistical simulation models for feed-forward blind-oversampling Clock and Data Recovery circuits, which determine the center of the data eye by observing the positions of edges in a data stream. The first model describes the traditional averaged phase picking method based on counting the edges in several domains, which divide the signal period. The second model was developed for a newly proposed CDR circuit, which selects the optimum sampling phase upon the occurrence of several consecutive edges in one sampling domain. Its simulation model is based on the periodic Markov chain representation of the domain-selection process. The averaged Bit-Error Rate can be simply computed from the steady-state of the chain. The computational complexity of statistical models is determined by the added jitter properties rather than by the actual level of bit-error rate. The models include random jitter, sinusoidal jitter, and frequency offset of transmit and receive clocks.",
  address="IEEE",
  booktitle="Proceedings of Int. Congress on Ultra Modern Telecommunications and Control Systems (ICUMT 2012)",
  chapter="94905",
  doi="10.1109/ICUMT.2012.6459713",
  howpublished="electronic, physical medium",
  institution="IEEE",
  year="2012",
  month="october",
  pages="497--501",
  publisher="IEEE",
  type="conference paper"
}