Publication detail

Experience With Allan Variance Method for MEMS Gyroscope Performance Characterization

VÁGNER, M. BENEŠ, P. HAVRÁNEK, Z.

Original Title

Experience With Allan Variance Method for MEMS Gyroscope Performance Characterization

Type

conference paper

Language

English

Original Abstract

The noise performance of four low cost and one reference classic gyroscope is estimated using the Allan variance (AV). The purpose is to highlight problems connected with this process and to decide which parameters are the most important if we want to choose the best gyro for a particular application. From the AV theory, basic kinds of noise and their characteristic slopes of the AV curve are known. For example, angle random walk has the slope of -1/2 and is caused by the white noise on the gyro output. However, the output of low cost gyro is usually corrupted by the more or less correlated noise. The level of correlation affects the slope of AV curve, so the better sensor has the slope closer to the theoretical value, thus a simpler model can be used. When collecting data for analysis, it is the most important to suppress temperature variations and vibrations. Attention should be paid to choose proper sampling frequency. Also the resolution and the connection of an acquisition card should be considered.

Keywords

gyroscopes, microelectromechanical devices, noise, performance evaluation, sensitivity analysis

Authors

VÁGNER, M.; BENEŠ, P.; HAVRÁNEK, Z.

RIV year

2012

Released

13. 5. 2012

Publisher

IEEE Service Center

Location

445 Hoes Lane Piscataway, NJ 08855-1331 USA

ISBN

978-1-4577-1771-0

Book

2012 IEEE International Instrumentation and Measurement Technology Conference (I2MTC 2012) Proceedings

Edition

1

Edition number

1

Pages from

1343

Pages to

1347

Pages count

5

BibTex

@inproceedings{BUT92093,
  author="Martin {Vágner} and Petr {Beneš} and Zdeněk {Havránek}",
  title="Experience With Allan Variance Method for MEMS Gyroscope Performance Characterization",
  booktitle="2012 IEEE International Instrumentation and Measurement Technology Conference (I2MTC 2012) Proceedings",
  year="2012",
  series="1",
  number="1",
  pages="1343--1347",
  publisher="IEEE Service Center",
  address="445 Hoes Lane
Piscataway, NJ 08855-1331 USA",
  isbn="978-1-4577-1771-0"
}