Publication detail

Critical role of near-field optics in the characterization of electro-optical devices

MAJZNER, J., TOMÁNEK, P., GRMELA, L., BENEŠOVÁ, M.

Original Title

Critical role of near-field optics in the characterization of electro-optical devices

Type

conference paper

Language

English

Original Abstract

In applications as diverse as waveguide and quantum-dot analysis, the local NSOM technique offers resolution beyond that possible with conventional confocal microscopy. The NSOM data of the active region of the waveguide are presented.

Keywords

near-field, electro-optical devices

Authors

MAJZNER, J., TOMÁNEK, P., GRMELA, L., BENEŠOVÁ, M.

RIV year

2003

Released

1. 1. 2003

Publisher

MJ Servis Ltd.

Location

Brno

ISBN

80-214-2388-8

Book

Radioelektronika 2003 Conference proceedings

Edition number

1

Pages from

280

Pages to

283

Pages count

4

BibTex

@inproceedings{BUT9179,
  author="Jiří {Majzner} and Pavel {Tománek} and Lubomír {Grmela} and Markéta {Benešová}",
  title="Critical role of near-field optics in the characterization of electro-optical devices",
  booktitle="Radioelektronika 2003 Conference proceedings",
  year="2003",
  volume="1",
  number="1",
  pages="4",
  publisher="MJ Servis Ltd.",
  address="Brno",
  isbn="80-214-2388-8"
}