Publication detail

Current density distribution, noise and non-linearity of thick film resistors

SEDLÁKOVÁ, V., MELKES, F., ŠIKULA, J., DOBIS, P., ROČAK, D., BELAVIČ, D., TACANO, M., HASHIGUCHI, S.

Original Title

Current density distribution, noise and non-linearity of thick film resistors

English Title

Current density distribution, noise and non-linearity of thick film resistors

Type

conference paper

Language

en

Original Abstract

The noise spectroscopy and third harmonic measurements were used to investigate effect of the contact electrode material on the thick film resistor quality and reliability. Strong dependence of non-linearity both on the type of the resistor paste and contract electrode material was observed. Dependence of noise quality indicator on the type of resistor paste is important, the influence of contact electrode material was studied using standard statistical evaluation. Thick film resistors with AgPd contact electrode have higher value of third harmonic voltage, but show better long term stability and reliability comparing with resistors with Ag contact electrode. From the SEM figures we determined, that the sharpness of AgPd contact electrode is approximately half of Ag contact electrode. It was proved experimentally that noise spectral density is proportional to electric field intensity, while third harmonic voltage depends on the third power of electric field intensity or current density. Modelling of the current distribution for different sharpness of metallic contact cross sections was performed. The model shows that the electrode geometry plays dominant role for current distribution in thick film resistor layer. The higher sharpness of metallic contact, the higher current density peak appears in the vicinity of the contact edge. The higher value of noise or non-linearity can be affected by the current density increase in the vicinity of contact – it is not necessary connected with irreversible processes at the contact interface. In this case the higher value of noise or non-linearity does not indicate lower reliability.

English abstract

The noise spectroscopy and third harmonic measurements were used to investigate effect of the contact electrode material on the thick film resistor quality and reliability. Strong dependence of non-linearity both on the type of the resistor paste and contract electrode material was observed. Dependence of noise quality indicator on the type of resistor paste is important, the influence of contact electrode material was studied using standard statistical evaluation. Thick film resistors with AgPd contact electrode have higher value of third harmonic voltage, but show better long term stability and reliability comparing with resistors with Ag contact electrode. From the SEM figures we determined, that the sharpness of AgPd contact electrode is approximately half of Ag contact electrode. It was proved experimentally that noise spectral density is proportional to electric field intensity, while third harmonic voltage depends on the third power of electric field intensity or current density. Modelling of the current distribution for different sharpness of metallic contact cross sections was performed. The model shows that the electrode geometry plays dominant role for current distribution in thick film resistor layer. The higher sharpness of metallic contact, the higher current density peak appears in the vicinity of the contact edge. The higher value of noise or non-linearity can be affected by the current density increase in the vicinity of contact – it is not necessary connected with irreversible processes at the contact interface. In this case the higher value of noise or non-linearity does not indicate lower reliability.

RIV year

2003

Released

01.01.2003

Publisher

IMAPS Germany

Location

Německo

Pages from

127

Pages to

132

Pages count

6

BibTex


@inproceedings{BUT9049,
  author="Vlasta {Sedláková} and František {Melkes} and Josef {Šikula} and Pavel {Dobis} and Dubravka {Ročak} and Darko {Belavič} and Munecazu {Tacano} and Sumihisa {Hashiguchi}",
  title="Current density distribution, noise and non-linearity of thick film resistors",
  annote="The noise spectroscopy and third harmonic measurements were used to investigate effect of the contact electrode material on the thick film resistor quality and reliability. Strong dependence of non-linearity both on the type of the resistor paste and contract electrode material was observed. Dependence of noise quality indicator on the type of resistor paste is important, the influence of contact electrode material was studied using standard statistical evaluation.  Thick film resistors with AgPd contact electrode have higher value of third harmonic voltage, but show better long term stability and reliability comparing with resistors with Ag contact electrode. From the SEM figures we determined, that the sharpness of AgPd contact electrode is approximately half of Ag contact electrode. It was proved experimentally that noise spectral density is proportional to electric field intensity, while third harmonic voltage depends on the third power of electric field intensity or current density. Modelling of the current distribution for different sharpness of metallic contact cross sections was performed. The model shows that the electrode geometry plays dominant role for current distribution in thick film resistor layer. The higher sharpness of metallic contact, the higher current density peak appears in the vicinity of the contact edge. The higher value of noise or non-linearity can be affected by the current density increase in the vicinity of contact – it is not necessary connected with irreversible processes at the contact interface. In this case the higher value of noise or non-linearity does not indicate lower reliability.",
  address="IMAPS Germany",
  booktitle="Proceedings of 14th European Microelectronics and Packaging Conference",
  chapter="9049",
  institution="IMAPS Germany",
  year="2003",
  month="january",
  pages="127",
  publisher="IMAPS Germany",
  type="conference paper"
}