Publication detail

Microelectronic structure reliability evaluation using response surface methodology

NOVOTNÝ, R.

Original Title

Microelectronic structure reliability evaluation using response surface methodology

English Title

Microelectronic structure reliability evaluation using response surface methodology

Type

conference paper

Language

en

Original Abstract

The need for reliability assessment of designed or adjusted electronic devices at the development stage creates new requirements for realiability prediction and evaluation. The traditional probabilistic approach is to a large degree replaced by empirical study approaches constructed on designed reliability testing experiments. This article presents the response surface methodology as a statistical tool for creating maps of reliability performance for supposed device operating condition.

English abstract

The need for reliability assessment of designed or adjusted electronic devices at the development stage creates new requirements for realiability prediction and evaluation. The traditional probabilistic approach is to a large degree replaced by empirical study approaches constructed on designed reliability testing experiments. This article presents the response surface methodology as a statistical tool for creating maps of reliability performance for supposed device operating condition.

RIV year

2003

Released

01.01.2003

Publisher

Zdeněk Novotný

Location

Brno

ISBN

8021424524

Book

10th Electronic Devices and Systems Conference 2003

Pages from

166

Pages to

169

Pages count

4

BibTex


@inproceedings{BUT8375,
  author="Radovan {Novotný}",
  title="Microelectronic structure reliability evaluation using response surface methodology",
  annote="The need for reliability assessment of designed or adjusted electronic devices at the development stage creates new requirements for realiability prediction and evaluation. The traditional probabilistic approach is to a large degree replaced by empirical study approaches constructed on designed reliability testing experiments. This article presents the response surface methodology as a statistical tool for creating maps of reliability performance for supposed device operating condition.",
  address="Zdeněk Novotný",
  booktitle="10th Electronic Devices and Systems Conference 2003",
  chapter="8375",
  institution="Zdeněk Novotný",
  year="2003",
  month="january",
  pages="166",
  publisher="Zdeněk Novotný",
  type="conference paper"
}