Publication detail

Investigation of the photon emission from the p-n junction of silicon solar cells studied by electro-optical methods

MACKŮ, R. TOMÁNEK, P. KOKTAVÝ, P.

Original Title

Investigation of the photon emission from the p-n junction of silicon solar cells studied by electro-optical methods

English Title

Investigation of the photon emission from the p-n junction of silicon solar cells studied by electro-optical methods

Type

journal article

Language

en

Original Abstract

We investigate localized defects in silicon solar cells. These imperfections represent a real problem because they can lead to long-term degradation and decreasing conversion efficiency of solar cells. Thus, this paper presents a systematic optical investigation of local defects and their correlation with rectangular microplasma fluctuations. A sensitive CCD camera has been used for mapping the surface photon emission from localized defects. The operation point of the samples has been set to reverse bias mode and varying electric fields were applied. It turns out that some solar cells exhibit imperfection in the bulk and also close to the cell edges. However, we confine our work here to bulk. Using a combination of optical investigations and electrical noise measurement in the time and spectral domain, we reveal a direct correlation between noise and photon emission. The results for several defect spots are presented in detail.

English abstract

We investigate localized defects in silicon solar cells. These imperfections represent a real problem because they can lead to long-term degradation and decreasing conversion efficiency of solar cells. Thus, this paper presents a systematic optical investigation of local defects and their correlation with rectangular microplasma fluctuations. A sensitive CCD camera has been used for mapping the surface photon emission from localized defects. The operation point of the samples has been set to reverse bias mode and varying electric fields were applied. It turns out that some solar cells exhibit imperfection in the bulk and also close to the cell edges. However, we confine our work here to bulk. Using a combination of optical investigations and electrical noise measurement in the time and spectral domain, we reveal a direct correlation between noise and photon emission. The results for several defect spots are presented in detail.

Keywords

Solar cell, microplasma noise, local defect, photon emission, electric breakdown

RIV year

2011

Released

15.10.2011

Publisher

SPIE

Location

USA

Pages from

1I1

Pages to

1I6

Pages count

6

BibTex


@article{BUT75594,
  author="Robert {Macků} and Pavel {Tománek} and Pavel {Koktavý}",
  title="Investigation of the photon emission from the p-n junction of silicon solar cells studied by electro-optical methods",
  annote="We investigate localized defects in silicon solar cells. These imperfections represent a real problem because they can
lead to long-term degradation and decreasing conversion efficiency of solar cells. Thus, this paper presents a systematic
optical investigation of local defects and their correlation with rectangular microplasma fluctuations. A sensitive CCD
camera has been used for mapping the surface photon emission from localized defects. The operation point of the
samples has been set to reverse bias mode and varying electric fields were applied. It turns out that some solar cells
exhibit imperfection in the bulk and also close to the cell edges. However, we confine our work here to bulk. Using a
combination of optical investigations and electrical noise measurement in the time and spectral domain, we reveal a
direct correlation between noise and photon emission. The results for several defect spots are presented in detail.",
  address="SPIE",
  chapter="75594",
  institution="SPIE",
  number="8306",
  volume="8036",
  year="2011",
  month="october",
  pages="1I1--1I6",
  publisher="SPIE",
  type="journal article"
}